Lee, S., Kim, H., Lee, S., Kim, H., Lee, S., & Kim, D. (2019, October). Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature. Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics, 2144-2148. https://doi.org/10.1109/SMC.2019.8914331
Chicago Style (17th ed.) CitationLee, Seung-Bo, Hakseung Kim, Seho Lee, Hyun-Ji Kim, Seong-Whan Lee, and Dong-Joo Kim. "Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature." Conference Proceedings - IEEE International Conference on Systems, Man, and Cybernetics Oct. 2019: 2144-2148. https://doi.org/10.1109/SMC.2019.8914331.
MLA (9th ed.) CitationLee, Seung-Bo, et al. "Classification of the Motion Artifacts in Near-infrared Spectroscopy Based on Wavelet Statistical Feature." Conference Proceedings - IEEE International Conference on Systems, Man, and Cybernetics, Oct. 2019, pp. 2144-2148, https://doi.org/10.1109/SMC.2019.8914331.