A Deep Neural Network Guided Testing Approach for Finite State Machines

• Published in: 2021 International Symposium on Devices, Circuits and Systems (ISDCS) pp. 1 - 6
• Main Authors: Rahaman, Habibur, Chattopadhyay, Santanu, Sengupta, Indranil
• Format: Conference Proceeding
• Language: English
• Published: IEEE 03.03.2021
• Subjects: Automata; Circuit faults; conformance testing; DNN; fault detection; FSM; Integrated circuit modeling; Neural networks; Testing; Training; Writing

Finite-State Machines (FSMs) lie at the heart of every digital system and verifying whether a given circuit implementation (B) of an FSM (A) conforms to its specification is an important task in the design cycle. In this work, a deep neural network (DNN) based technique for testing FSMs is developed...