APA (7th ed.) Citation

Rahaman, H., Chattopadhyay, S., & Sengupta, I. (2021, March 3). A Deep Neural Network Guided Testing Approach for Finite State Machines. 2021 International Symposium on Devices, Circuits and Systems (ISDCS), 1-6. https://doi.org/10.1109/ISDCS52006.2021.9397900

Chicago Style (17th ed.) Citation

Rahaman, Habibur, Santanu Chattopadhyay, and Indranil Sengupta. "A Deep Neural Network Guided Testing Approach for Finite State Machines." 2021 International Symposium on Devices, Circuits and Systems (ISDCS) 3 Mar. 2021: 1-6. https://doi.org/10.1109/ISDCS52006.2021.9397900.

MLA (9th ed.) Citation

Rahaman, Habibur, et al. "A Deep Neural Network Guided Testing Approach for Finite State Machines." 2021 International Symposium on Devices, Circuits and Systems (ISDCS), 3 Mar. 2021, pp. 1-6, https://doi.org/10.1109/ISDCS52006.2021.9397900.