Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test

• Published in: Proceedings - International Test Conference pp. 1 - 5
• Main Authors: Oh, Youngsu, Han, Dongmin, Go, Byeongseon, Lee, Seungtaek, Jeong, Woosik
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2020
• Subjects: automatic test equipment; Data mining; eye diagram; high-speed; Jitter; memory test; Oscilloscopes; Pins; Random access memory; signal integrity; Timing

This paper presents a method for the evaluation of the eye diagram of a signal by analyzing the atypical Shmoo plot extracted from an automatic test equipment using a loopback technique. The loopback technique was used to minimize the external noise generated by an oscilloscope, thereby making it ea...