Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test - Oh, Youngsu; Han, Dongmin; Go, Byeongseon; Lee, Seungtaek; Jeong, Woosik (Proceedings - International Test Conference, 2020)
Keywords: automatic test equipment; Data mining; eye diagram; high-speed; Jitter; memory test; Oscilloscopes; Pins; Random access memory; signal integrity; Timing