APA (7th ed.) Citation

Oh, Y., Han, D., Go, B., Lee, S., & Jeong, W. (2020, November). Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. Proceedings - International Test Conference, 1-5. https://doi.org/10.1109/ITC44778.2020.9325279

Chicago Style (17th ed.) Citation

Oh, Youngsu, Dongmin Han, Byeongseon Go, Seungtaek Lee, and Woosik Jeong. "Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test." Proceedings - International Test Conference Nov. 2020: 1-5. https://doi.org/10.1109/ITC44778.2020.9325279.

MLA (9th ed.) Citation

Oh, Youngsu, et al. "Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test." Proceedings - International Test Conference, Nov. 2020, pp. 1-5, https://doi.org/10.1109/ITC44778.2020.9325279.