Analysis of Transient HTRB Leakage in a SiC Field Ring Termination - Potera, R. R.; Witt, T.; Zheng, Y. (IEEE International Reliability Physics Symposium proceedings, 2020)
Keywords: H3TRB; HTRB; Impact ionization; Leakage; Photonic band gap; Sensitivity; SiC; Silicon carbide; Silicon devices; Temperature sensors; termination; Transient; Transient analysis