Analytical formulae for computing the critical current of an Nb3Sn strand under bending

• Published in: Superconductor science & technology Vol. 23; no. 12; p. 125005
• Main Authors: Ciazynski, D, Torre, A
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.12.2010
• Subjects: Bending; Electric wire; Electrical resistivity; Mathematical analysis; Mathematical models; Strain; Strands
• ISSN: 0953-2048; 1361-6668
• DOI: 10.1088/0953-2048/23/12/125005

Works on bending strain in Nb3Sn wires were initiated in support of the 'react-and-wind' technique used to manufacture superconducting coils. More recently, the bending strains of Nb3Sn strands in cable-in-conduit conductors (CICC) under high Lorentz forces have been thought to be partly responsible for the degradation of the conductor performance in terms of critical current and n index, particularly for the international thermonuclear experimental reactor (ITER) conductors. This has led to a new wave of experiments and modelling on this subject. The computation of the current transport capability in an Nb3Sn wire under uniform bending used to be carried out through the so-called Ekin's models, and more recently through numerical simulations with electric networks. The flaws of Ekin's models are that they consider only two extreme cases or limits, namely the so-called long twist pitch (LTP) or short twist pitch (STP) cases, and that these models only allow computation of a value for the critical current without reference to the n index of the superconducting filaments (i.e. this index is implicitly assumed to be infinite). Although the numerical models allow a fine description of the wire under operation and can take into account the filament's n index, they need a refined meshing to be accurate enough and their results may be sensitive to boundary conditions (i.e. current injection in the wire), also general intrinsic parameters cannot be easily identified. In this paper, we propose clearly to go further than Ekin's models by developing, from a homogeneous model and Maxwell's equations, an analytical model to establish the general equation governing the evolution of the electric field inside an Nb3Sn strand under uniform bending (with possible longitudinal strain). Within the usual strand fabrication limits, this equation allows the definition of one single parameter to discriminate the STP and LTP cases. It is also shown that whereas Ekin's LTP model corresponds well to a limiting solution of the problem when the transverse resistivity tends toward zero (or the twist pitch tends towards infinity), Ekin's STP model must be modified (improved) when the filament's n index is finite. Since the general equation cannot be solved analytically, we start from the LTP model and develop a first order correction to be applied when the transverse resistivity, the twist pitch and the filament's n index are finite. Using a simple but realistic law for depicting the strain dependence of the critical current density in the Nb3Sn filaments, we can fully compute the corrected expression and give the result under a general analytical formula for a strand submitted to both bending and compressive/tensile strains. The results are then compared in two different cases with those obtained with the numerical code CARMEN (based on an electrical network) developed at CEA. Last, a semi-empirical formula has been developed to evolve continuously from the LTP limit to the improved STP limit when the transverse resistivity evolves from zero to infinity. The results given by this formula are again compared with the numerical simulations in two different cases. Last, comparisons with experimental results are discussed.