Impact of NaOH solution surface treatment on Al2O3/β-Ga2O3 MOS capacitors

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Published inSemiconductor science and technology Vol. 39; no. 8
Main Authors Fang, Paiwen, Liao, Zhengyi, Su, Danni, Liang, Jun, Wang, Xinzhong, Pei, Yanli
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.08.2024
Subjects
Online AccessGet full text
ISSN0268-1242
1361-6641
DOI10.1088/1361-6641/ad59bc

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Author Fang, Paiwen
Wang, Xinzhong
Su, Danni
Pei, Yanli
Liao, Zhengyi
Liang, Jun
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  givenname: Zhengyi
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  surname: Pei
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  organization: Foshan Institute of Sun Yat-Sen University , Foshan 528225, People’s Republic of China
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SubjectTerms ALD-Al
Ga
MOSCAP
NaOH treatment
Title Impact of NaOH solution surface treatment on Al2O3/β-Ga2O3 MOS capacitors
URI https://iopscience.iop.org/article/10.1088/1361-6641/ad59bc
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