Preliminary temperature accelerated life test (ALT) on III-V commercial concentrator triple-junction solar cells

• Published in: 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 pp. 1 - 6
• Main Authors: Espinet-Gonzalez, P., Araki, K., Algora, C., Orlando, V., Nunez, N., Vazquez, M., Bautista, J., Xiugang, H., Barrutia, L., Rey-Stolle, I.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2012
• Subjects: Accelerated life test; Acceleration; ALT; concentrator; CPV; Current density; III-V; Life estimation; Photovoltaic cells; Photovoltaics; Reliability; solar cells; Stress; Temperature

A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a mod...