Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator - Janezic, M.D.; Kuester, E.F.; Jarvis, J.B. (2004 IEEE MTT-S International Microwave Symposium, 2004)
Keywords: Acoustic wave devices, piezoelectric and piezoresistive devices; Applied sciences; Circuit properties; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Electric, optical and optoelectronic circuits; Electronic circuits; Electronics; Exact sciences and technology; Frequency measurement; Loss measurement; Magnetic field measurement; Magnetic resonance; Oscillators, resonators, synthetizers; Permittivity measurement; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Tellurium; Testing, measurement, noise and reliability; Dielectric loss; Permittivity measurement; Dielectric resonator; Dielectric measurement; Dielectric substrate; Electric field; Theoretical model; Wide band; Cylindrical cavity; Circular cylinder; Magnetic field; Complex permittivity; Permittivity; Non destructive test