Awonuga, O., Madden, K., Coleman, S., Kerr, D., & Quinn, J. (2025, March 17). Computational Intelligence Approaches to Defect Detection in 3D Printing. 2025 IEEE Symposium on Computational Intelligence on Engineering/Cyber Physical Systems (CIES), 1-7. https://doi.org/10.1109/CIES64955.2025.11007634
Chicago Style (17th ed.) CitationAwonuga, Oluwaseun, Kyle Madden, Sonya Coleman, Dermot Kerr, and Justin Quinn. "Computational Intelligence Approaches to Defect Detection in 3D Printing." 2025 IEEE Symposium on Computational Intelligence on Engineering/Cyber Physical Systems (CIES) 17 Mar. 2025: 1-7. https://doi.org/10.1109/CIES64955.2025.11007634.
MLA (9th ed.) CitationAwonuga, Oluwaseun, et al. "Computational Intelligence Approaches to Defect Detection in 3D Printing." 2025 IEEE Symposium on Computational Intelligence on Engineering/Cyber Physical Systems (CIES), 17 Mar. 2025, pp. 1-7, https://doi.org/10.1109/CIES64955.2025.11007634.