Substrate NPN Extraction from Capacitance Field Solver

We demonstrate a parasitic substrate NPN extraction method, using a capacitance extraction field solver. The physics behind the method is the analogy between carrier diffusion (Fick's law) and the displacement current in quasi-electrostatics. Using our method, we calibrated a model and reproduc...

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Published in2024 46th Annual EOS/ESD Symposium (EOS/ESD) Vol. 46; pp. 1 - 7
Main Authors Xu, Chuan, Rivard, Michael, Zhu, Yuanqing, Liu, William
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 16.09.2024
Subjects
Capacitance
Circuit simulation
Physics
Substrates
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DOI10.23919/EOS/ESD61719.2024.10702111

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Abstract We demonstrate a parasitic substrate NPN extraction method, using a capacitance extraction field solver. The physics behind the method is the analogy between carrier diffusion (Fick's law) and the displacement current in quasi-electrostatics. Using our method, we calibrated a model and reproduced product failure in two of our parts through circuit simulation.
AbstractList We demonstrate a parasitic substrate NPN extraction method, using a capacitance extraction field solver. The physics behind the method is the analogy between carrier diffusion (Fick's law) and the displacement current in quasi-electrostatics. Using our method, we calibrated a model and reproduced product failure in two of our parts through circuit simulation.
Author Xu, Chuan
Rivard, Michael
Liu, William
Zhu, Yuanqing
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  givenname: Michael
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  organization: Analog Devices, Inc.,Dallas,TX,USA,75254
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  givenname: Yuanqing
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  organization: Analog Devices, Inc.,Chandler,AZ,USA,85225
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  givenname: William
  surname: Liu
  fullname: Liu, William
  organization: Analog Devices, Inc.,Beaverton,OR,USA,97225
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Snippet We demonstrate a parasitic substrate NPN extraction method, using a capacitance extraction field solver. The physics behind the method is the analogy between...
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StartPage 1
SubjectTerms Capacitance
Circuit simulation
Physics
Substrates
Title Substrate NPN Extraction from Capacitance Field Solver
URI https://ieeexplore.ieee.org/document/10702111
Volume 46
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