ESD-EOS-OVP Protection Network for Battery Pins

The main component level study for combined ESD-EOS protection network specific for battery monitoring pin protection is presented. The focus is made on the suitability of the ESD network for EOS and overvoltage protection. Both short TLP and long stress pulse regime experimental results are present...

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Published in2024 46th Annual EOS/ESD Symposium (EOS/ESD) Vol. 46; pp. 1 - 7
Main Authors Vashchenko, Vladislav, Sarbishaei, Hossein, Kontos, Dimitrios, Shibkov, Andrei
Format Conference Proceeding
LanguageEnglish
Published EOS/ESD Association, Inc 16.09.2024
Subjects
Batteries
Earth Observing System
Electrostatic discharges
Monitoring
Pins
Protection
Stress
Voltage control
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DOI10.23919/EOS/ESD61719.2024.10702175

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Abstract The main component level study for combined ESD-EOS protection network specific for battery monitoring pin protection is presented. The focus is made on the suitability of the ESD network for EOS and overvoltage protection. Both short TLP and long stress pulse regime experimental results are presented for the simplified version of the network based on stacked avalanche diode and NLDMOS components.
AbstractList The main component level study for combined ESD-EOS protection network specific for battery monitoring pin protection is presented. The focus is made on the suitability of the ESD network for EOS and overvoltage protection. Both short TLP and long stress pulse regime experimental results are presented for the simplified version of the network based on stacked avalanche diode and NLDMOS components.
Author Sarbishaei, Hossein
Kontos, Dimitrios
Vashchenko, Vladislav
Shibkov, Andrei
Author_xml – sequence: 1
  givenname: Vladislav
  surname: Vashchenko
  fullname: Vashchenko, Vladislav
  organization: Analog Devices Corp,San Jose,CA,USA,95134
– sequence: 2
  givenname: Hossein
  surname: Sarbishaei
  fullname: Sarbishaei, Hossein
  organization: Analog Devices Corp,San Jose,CA,USA,95134
– sequence: 3
  givenname: Dimitrios
  surname: Kontos
  fullname: Kontos, Dimitrios
  organization: Analog Devices Corp,San Jose,CA,USA,95134
– sequence: 4
  givenname: Andrei
  surname: Shibkov
  fullname: Shibkov, Andrei
  organization: Angstrom Design Automation LLC,CA,USA
BookMark eNo1j8FKAzEURSPYhdb-gYuA65nm5U0myVLrWIXSGai6LcnMCwR1RtKA9O-tqJt7N-ceuJfsfJxGYuwGRCnRgl027W7Z7O5r0GBLKWRVgtBCglZnbGG1AWUUalRYX7AfsDgNiva1412aMvU5TiPfUv6a0hsPU-J3LmdKR97F8XDFZsG9H2jx13P28tA8rx6LTbt-Wt1uigi6zkVvvZaVFOiHKlTCIIEwEkH20nsMNQTwpwhQDQ7JOEXWkHVuAATCHnDOrn-9kYj2nyl-uHTc___AbwdeQYI
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.23919/EOS/ESD61719.2024.10702175
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9781585373536
1585373532
EndPage 7
ExternalDocumentID 10702175
Genre orig-research
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-i176t-c9b724203bd4f4083e1082312c2bb3f61f1b61ff14da3e8a5e98e9aad131e3c13
IEDL.DBID RIE
IngestDate Wed Oct 16 05:58:50 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i176t-c9b724203bd4f4083e1082312c2bb3f61f1b61ff14da3e8a5e98e9aad131e3c13
PageCount 7
ParticipantIDs ieee_primary_10702175
PublicationCentury 2000
PublicationDate 2024-Sept.-16
PublicationDateYYYYMMDD 2024-09-16
PublicationDate_xml – month: 09
  year: 2024
  text: 2024-Sept.-16
  day: 16
PublicationDecade 2020
PublicationTitle 2024 46th Annual EOS/ESD Symposium (EOS/ESD)
PublicationTitleAbbrev EOS/ESD
PublicationYear 2024
Publisher EOS/ESD Association, Inc
Publisher_xml – name: EOS/ESD Association, Inc
Score 1.8850107
Snippet The main component level study for combined ESD-EOS protection network specific for battery monitoring pin protection is presented. The focus is made on the...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Batteries
Earth Observing System
Electrostatic discharges
Monitoring
Pins
Protection
Stress
Voltage control
Title ESD-EOS-OVP Protection Network for Battery Pins
URI https://ieeexplore.ieee.org/document/10702175
Volume 46
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFH64HcSTihN_U9BrumVJf-SsG0NwG8zJbiNJX2AInWh70L_el3RTFAQvIWkpfWkTvpe873sBuEnRZtIlmknbK5jUQjEldcIS48M4NKrzENF9GKejubxfJIuNWD1oYRAxkM8w9tUQyy_WtvZbZTTDM-9CJy1o0ThrxFq7cB3ozIqr7mAy6w5mdwTK3GtQ-jLePvHj7JQAHcN9GG9f2jBGnuO6MrH9-JWP8d9WHUDnW6UXTb_w5xB2sDwCbxkjC9nkaervVoFqVUbjhu4dkY8aNTk136PpqnzrwHw4eLwdsc2hCGzFs7RiVpmMYLUnTCGdJAcKuQ-W8b7tGyNcyh03VDguCy0w1wmqHJXWBRccheXiGNrlusQTiBytdkSuVe6MonULtYzLrSyMTgj3MzyFju_t8qXJe7HcdvTsj-vnsOc_umdT8PQC2tVrjZcE2ZW5Cr_qE3DIlGs
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFH7oBPWk4sTfFvSablmStjlrx9StK2yT3UaSJjCETrQ76F9vkm6KguAlJA2lLyThe-n7vheAm0irmBomEFXtAlFBOOJUMMSkC-PYVZ34iO4gi3oT-jBl05VY3WthtNaefKZDV_Wx_GKhlu5Xmd3hsXOh2SZsWeCnrJZrbcO1JzRzzFvpcNRKR3cWlrFToXRouH7nx-0pHjy6e5CtP1tzRp7DZSVD9fErI-O_7dqH5rdOL8i_EOgANnR5CM4yZC1Ew6fc9VaebFUGWU34DqyXGtRZNd-DfF6-NWHSTce3PbS6FgHNcRxVSHEZW2BtE1lQQ60LpbELl-GO6khJTIQNlrYwmBaC6EQwzRPNhSgwwZooTI6gUS5KfQyBsecdkgieGMntycW2pEkULaRgFvljfQJNN9rZS535YrYe6Okfz69gpzce9Gf9--zxDHbdBDhuBY7OoVG9LvWFBfBKXvpp-wRr1pe4
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2024+46th+Annual+EOS%2FESD+Symposium+%28EOS%2FESD%29&rft.atitle=ESD-EOS-OVP+Protection+Network+for+Battery+Pins&rft.au=Vashchenko%2C+Vladislav&rft.au=Sarbishaei%2C+Hossein&rft.au=Kontos%2C+Dimitrios&rft.au=Shibkov%2C+Andrei&rft.date=2024-09-16&rft.pub=EOS%2FESD+Association%2C+Inc&rft.volume=46&rft.spage=1&rft.epage=7&rft_id=info:doi/10.23919%2FEOS%2FESD61719.2024.10702175&rft.externalDocID=10702175