The Impact of Nanoscale CMOS Devices Scaling and Variations on mm-Wave CMOS Performance - Guo, Jyh-Chyurn; Ou, Jyun-Rong (2024 19th European Microwave Integrated Circuits Conference (EuMIC), 2024)
Keywords: Analytical models; CMOS; fMAX; Foundries; High frequency; Integrated circuit modeling; layout; mm-Wave; nanoscale device; Nanoscale devices; Object recognition; Optimization; Parameter extraction; PDK; Performance evaluation; scaling; Semiconductor device modeling; variations