An Efficient and Cost-effective Method to Detect and Analyze ESD CDM Risks in Designs - Ghosh, Subhadeep; Ray, Kaustav; Sankaralingam, Raj; Pok, Rith (2024 46th Annual EOS/ESD Symposium (EOS/ESD), 2024)
Keywords: Breakdown voltage; Electric breakdown; Electrostatic discharges; Engines; Junctions; Logic gates; Pattern recognition; Receivers; Risk analysis; Topology