The failure mode study of the polymer ball interconnected IC package under board level thermal mechanical stress

The polymer cored solder interconnect has been evaluated in board level strain concerned ball grid array type IC package for many years. The innovative ball design is developed to compensate the board level reliability weakness of current metal alloy interconnect such as mechanical and thermal fatig...

Full description

Saved in:
Bibliographic Details
Published inProceedings of technical papers (International Microsystems, Packaging, Assembly, and Circuits Technology Conference. Print) pp. 424 - 427
Main Authors Cheng-Chih Chen, Lee, Jeffrey, Lee, Dem, Lin, Alice
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2016
Subjects
Online AccessGet full text
ISSN2150-5942
DOI10.1109/IMPACT.2016.7800064

Cover

Loading…
Abstract The polymer cored solder interconnect has been evaluated in board level strain concerned ball grid array type IC package for many years. The innovative ball design is developed to compensate the board level reliability weakness of current metal alloy interconnect such as mechanical and thermal fatigue endurance due to its unique spherical polymeric core able to absorb the strain energy generated during the service in field. In terms of large size BGA packages such as Ceramic BGA and FCBGA, which suffer more significant solder joint strain on the package corner, the polymer cored solder interconnect is adopted to be capable of withstanding solder joint deformation between PCB and package under board level stress due to its ductile characteristics. In the study, the daisy chained ceramic substrate based BGA with 29×29 mm sq. 483 IO, 1.27 mm pitch was surface mounted on OSP finished PCB with SAC305 NC solder paste, then subject to temperature cycling test until 3000 cycle at 0/100 degree C with 10min dwell. 2 types of solder ball, one is SAC305 and another is SnAg coated polymer core, were ball attached through standard package assembly process. After 3000 cycle, the electrical failure sample was taken for various failure mode observations through dye and pry analysis and cross section under OM and SEM, respectively. The typical failure mode across IC package was investigated for comparison between SAC305 and polymer cored solder and concluded polymer cored solder will outperform SAC305.
AbstractList The polymer cored solder interconnect has been evaluated in board level strain concerned ball grid array type IC package for many years. The innovative ball design is developed to compensate the board level reliability weakness of current metal alloy interconnect such as mechanical and thermal fatigue endurance due to its unique spherical polymeric core able to absorb the strain energy generated during the service in field. In terms of large size BGA packages such as Ceramic BGA and FCBGA, which suffer more significant solder joint strain on the package corner, the polymer cored solder interconnect is adopted to be capable of withstanding solder joint deformation between PCB and package under board level stress due to its ductile characteristics. In the study, the daisy chained ceramic substrate based BGA with 29×29 mm sq. 483 IO, 1.27 mm pitch was surface mounted on OSP finished PCB with SAC305 NC solder paste, then subject to temperature cycling test until 3000 cycle at 0/100 degree C with 10min dwell. 2 types of solder ball, one is SAC305 and another is SnAg coated polymer core, were ball attached through standard package assembly process. After 3000 cycle, the electrical failure sample was taken for various failure mode observations through dye and pry analysis and cross section under OM and SEM, respectively. The typical failure mode across IC package was investigated for comparison between SAC305 and polymer cored solder and concluded polymer cored solder will outperform SAC305.
Author Cheng-Chih Chen
Lee, Jeffrey
Lee, Dem
Lin, Alice
Author_xml – sequence: 1
  surname: Cheng-Chih Chen
  fullname: Cheng-Chih Chen
  email: chih_chen@istgroup.com
  organization: Global Eng. Dev. Dept., iST-Integrated Service Technol., Inc., Hsinchu, Taiwan
– sequence: 2
  givenname: Jeffrey
  surname: Lee
  fullname: Lee, Jeffrey
  organization: Global Eng. Dev. Dept., iST-Integrated Service Technol., Inc., Hsinchu, Taiwan
– sequence: 3
  givenname: Dem
  surname: Lee
  fullname: Lee, Dem
  organization: Global Eng. Dev. Dept., iST-Integrated Service Technol., Inc., Hsinchu, Taiwan
– sequence: 4
  givenname: Alice
  surname: Lin
  fullname: Lin, Alice
  organization: Global Eng. Dev. Dept., iST-Integrated Service Technol., Inc., Hsinchu, Taiwan
BookMark eNotUMlOwzAUNAgkSukX9OIfSHmOs9jHKmKpVASHcq68PNOA40R2itS_JxU9zYxmOcw9uQl9QEKWDFaMgXzcvH2sm90qB1atagEAVXFFFrIWrAQJRV3J-prM8kllpSzyO7JI6XuKcWBQ8GJGht0BqVOtP0akXW-RpvFoT7R3dJycofenDiPVynvahhGj6UNAM6Klm4YOyvyoL6THYM-hXkVLPf6iP5djpzzt0BxUaM1E0xgxpQdy65RPuLjgnHw-P-2a12z7_rJp1tusZXU5Zs66XJvC6EpzZ3MruC6VkMopA7p0EgS3IAVHzqASFTiJaFktTV46prnhc7L8320RcT_EtlPxtL98xP8AufxfEw
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/IMPACT.2016.7800064
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 9781509047697
1509047697
EISSN 2150-5942
EndPage 427
ExternalDocumentID 7800064
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IPLJI
OCL
RIE
RIL
RNS
ID FETCH-LOGICAL-i175t-fdf2bc4cb6b3fd2d83b5a89afac0b5f9083d0983e3106860f9eed179c25f1b3c3
IEDL.DBID RIE
IngestDate Wed Aug 27 02:01:48 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-fdf2bc4cb6b3fd2d83b5a89afac0b5f9083d0983e3106860f9eed179c25f1b3c3
PageCount 4
ParticipantIDs ieee_primary_7800064
PublicationCentury 2000
PublicationDate 2016-Oct.
PublicationDateYYYYMMDD 2016-10-01
PublicationDate_xml – month: 10
  year: 2016
  text: 2016-Oct.
PublicationDecade 2010
PublicationTitle Proceedings of technical papers (International Microsystems, Packaging, Assembly, and Circuits Technology Conference. Print)
PublicationTitleAbbrev IMPACT
PublicationYear 2016
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0003010434
Score 1.6313426
Snippet The polymer cored solder interconnect has been evaluated in board level strain concerned ball grid array type IC package for many years. The innovative ball...
SourceID ieee
SourceType Publisher
StartPage 424
SubjectTerms CBGA
Ceramics
Lead
Materials reliability
polymer cored ball
Polymers
SAC
Soldering
Strain
Thermal mechanical
Title The failure mode study of the polymer ball interconnected IC package under board level thermal mechanical stress
URI https://ieeexplore.ieee.org/document/7800064
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb4JAEN6op_bShzZ9Zw49FgQWVjg2pkab2HjQxJthX4kRxRg8tL--M0DtIz30RggbYGfZ-Wb4vhnGHjRPtVGechAKY4AiQuFIS0COcwQP6A_StCTIvorhLHyZR_MGezxoYYwxJfnMuHRY_svXudpTqqzbi0sX2mRNDNwqrdYhn8IpsOBhXVjI95LuaDx56k-JvSXceuSPFiqlBxmcsPHnvSviyMrdF9JV77_KMv734U5Z50urB5ODFzpjDbM5Z8ffygy22RbXAth0SQx0oNY3UBaVhdwCwj_Y5tnb2uxAplkGVD5ip4j9ohCLwqgPGFSvcNMBUpvhRTkuKciIakSDcVvPYG1IPkzWhkp60mGzwfO0P3TqTgvOEuFD4VhtA6lCJYXkVgc65jJK4yS1qfJkZBPEadpLYkqYkqTEswm-FH7KKoisL7niF6y1yTfmkoEIfCmN6GnhyzAyiTSx1EmsYk_ZnjXhFWvT3C22VTGNRT1t13-fvmFHZL-KPXfLWsVub-4QBRTyvjT_B6WBtOA
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEN4gHtSLDzC-3YNHW0q3Ld2jIRJQIBwg4Ub2mRAKJaQc9Nc701Z8xIO3pumm7e5055vp980Q8qCZ0EZ5ygEoDAFKFESOtAjkGAPwAP5AiJwgO4y6k-BlGk4r5HGnhTHG5OQz4-Jh_i9fp2qLqbJGK85d6B7ZB78f8EKttcuoMAwtWFCWFmp6vNEbjJ7aY-RvRW459kcTldyHdI7J4PPuBXVk4W4z6ar3X4UZ__t4J6T-pdajo50fOiUVszojR98KDdbIGqyBWjFHDjrF5jc0LytLU0sBANJ1mrwtzYZKkSQUC0hsFPJfFKBR2mtTCKsXsO1Q1JvBRSkYFU2QbISDYWNP6NKggBjXmxbikzqZdJ7H7a5T9lpw5gAgMsdq60sVKBlJZrWvYyZDEXNhhfJkaDkgNe3xGFOmKCrxLIeXgo9Z-aFtSqbYOamu0pW5IDTym1KaqKWjpgxCw6WJpeaxij1lW9YEl6SGczdbF-U0ZuW0Xf19-p4cdMeD_qzfG75ek0Ncy4JLd0Oq2WZrbgETZPIuN4UPTWW4MA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+technical+papers+%28International+Microsystems%2C+Packaging%2C+Assembly%2C+and+Circuits+Technology+Conference.+Print%29&rft.atitle=The+failure+mode+study+of+the+polymer+ball+interconnected+IC+package+under+board+level+thermal+mechanical+stress&rft.au=Cheng-Chih+Chen&rft.au=Lee%2C+Jeffrey&rft.au=Lee%2C+Dem&rft.au=Lin%2C+Alice&rft.date=2016-10-01&rft.pub=IEEE&rft.eissn=2150-5942&rft.spage=424&rft.epage=427&rft_id=info:doi/10.1109%2FIMPACT.2016.7800064&rft.externalDocID=7800064