Chen, C., Lee, J., Lee, D., & Lin, A. (2016, October). The failure mode study of the polymer ball interconnected IC package under board level thermal mechanical stress. Proceedings of technical papers (International Microsystems, Packaging, Assembly, and Circuits Technology Conference. Print), 424-427. https://doi.org/10.1109/IMPACT.2016.7800064
Chicago Style (17th ed.) CitationChen, Cheng-Chih, Jeffrey Lee, Dem Lee, and Alice Lin. "The Failure Mode Study of the Polymer Ball Interconnected IC Package Under Board Level Thermal Mechanical Stress." Proceedings of Technical Papers (International Microsystems, Packaging, Assembly, and Circuits Technology Conference. Print) Oct. 2016: 424-427. https://doi.org/10.1109/IMPACT.2016.7800064.
MLA (9th ed.) CitationChen, Cheng-Chih, et al. "The Failure Mode Study of the Polymer Ball Interconnected IC Package Under Board Level Thermal Mechanical Stress." Proceedings of Technical Papers (International Microsystems, Packaging, Assembly, and Circuits Technology Conference. Print), Oct. 2016, pp. 424-427, https://doi.org/10.1109/IMPACT.2016.7800064.