APA (7th ed.) Citation

Peleato, B., & Agarwal, R. (2012, June). Maximizing MLC NAND lifetime and reliability in the presence of write noise. 2012 IEEE International Conference on Communications (ICC), 3752-3756. https://doi.org/10.1109/ICC.2012.6363639

Chicago Style (17th ed.) Citation

Peleato, B., and R. Agarwal. "Maximizing MLC NAND Lifetime and Reliability in the Presence of Write Noise." 2012 IEEE International Conference on Communications (ICC) Jun. 2012: 3752-3756. https://doi.org/10.1109/ICC.2012.6363639.

MLA (9th ed.) Citation

Peleato, B., and R. Agarwal. "Maximizing MLC NAND Lifetime and Reliability in the Presence of Write Noise." 2012 IEEE International Conference on Communications (ICC), Jun. 2012, pp. 3752-3756, https://doi.org/10.1109/ICC.2012.6363639.