Improved reliability of rarely switching CMOS circuits in ULSI devices

In this work, novel configurations of rarely switching ULSI I/O circuits, which provide a "refresh" operation allowing for temporal bias removal without any changes in the logic state or electrical characteristics of these circuits, are presented. This bias removal significantly reduces th...

Full description

Saved in:
Bibliographic Details
Published in2012 IEEE International Integrated Reliability Workshop Final Report pp. 179 - 182
Main Authors Sofer, S., Livshits, P., Priel, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2012
Subjects
Integrated circuit reliability
MOSFETs
Stress
Switching circuits
Timing
Ultra large scale integration
Online AccessGet full text

Cover

Abstract In this work, novel configurations of rarely switching ULSI I/O circuits, which provide a "refresh" operation allowing for temporal bias removal without any changes in the logic state or electrical characteristics of these circuits, are presented. This bias removal significantly reduces the aging of the circuits and allows for the lessening of design timing margins, thus reducing the overall design costs.
AbstractList In this work, novel configurations of rarely switching ULSI I/O circuits, which provide a "refresh" operation allowing for temporal bias removal without any changes in the logic state or electrical characteristics of these circuits, are presented. This bias removal significantly reduces the aging of the circuits and allows for the lessening of design timing margins, thus reducing the overall design costs.
Author Sofer, S.
Priel, M.
Livshits, P.
Author_xml – sequence: 1
  givenname: S.
  surname: Sofer
  fullname: Sofer, S.
  email: sergey.sofer@freescale.com
  organization: Freescale Semicond. Israel Ltd., Herzlia, Israel
– sequence: 2
  givenname: P.
  surname: Livshits
  fullname: Livshits, P.
  organization: Sch. of Eng., Bar-Ilan Univ., Ramat Gan, Israel
– sequence: 3
  givenname: M.
  surname: Priel
  fullname: Priel, M.
  organization: Freescale Semicond. Israel Ltd., Herzlia, Israel
BookMark eNo9kFFLwzAUhaNOcJv7AeJL_kDnvUmapI8ynBYqA-fwcWTJrUa2brR1o__egsOnA9-BD84ZsUG1r4ixO4QpImQPef72MRWAYqqVtlkKF2yEShspTIrqkg2FNCqxIPXVf6EyMWBDzCQk1iq8YZOm-QaAXqglwpDN892h3h8p8Jq20W3iNrYd35e8dj3oeHOKrf-K1SefvS6W3Mfa_8S24bHiq2KZ80DH6Km5Zdel2zY0OeeYreZP77OXpFg857PHIolo0jahACbTTgZMPTqyhN4EFxyggRKFC4pCGcRG6n4TBUKy0gYPqL0QREaO2f2fNxLR-lDHnau79fkP-QuUH1H4
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/IIRW.2012.6468950
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEL
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEL
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1467327514
9781467327510
9781467327527
1467327522
EISSN 2374-8036
EndPage 182
ExternalDocumentID 6468950
Genre orig-research
GroupedDBID 29I
29J
6IE
6IF
6IH
6IK
6IL
6IN
AAJGR
ABLEC
ADZIZ
AI.
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IPLJI
JC5
M43
OCL
RIE
RIL
RNS
VH1
ID FETCH-LOGICAL-i175t-ed0796a3d15c1ae8e1c7dada0170f12ad4edfd2b36275ede1e838dc016c22ee73
IEDL.DBID RIE
ISBN 1467327492
9781467327497
ISSN 1930-8841
IngestDate Wed Jun 26 19:23:35 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-ed0796a3d15c1ae8e1c7dada0170f12ad4edfd2b36275ede1e838dc016c22ee73
PageCount 4
ParticipantIDs ieee_primary_6468950
PublicationCentury 2000
PublicationDate 2012-Oct.
PublicationDateYYYYMMDD 2012-10-01
PublicationDate_xml – month: 10
  year: 2012
  text: 2012-Oct.
PublicationDecade 2010
PublicationTitle 2012 IEEE International Integrated Reliability Workshop Final Report
PublicationTitleAbbrev IIRW
PublicationYear 2012
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001106310
ssj0020138
Score 1.8744637
Snippet In this work, novel configurations of rarely switching ULSI I/O circuits, which provide a "refresh" operation allowing for temporal bias removal without any...
SourceID ieee
SourceType Publisher
StartPage 179
SubjectTerms Integrated circuit reliability
MOSFETs
Stress
Switching circuits
Timing
Ultra large scale integration
Title Improved reliability of rarely switching CMOS circuits in ULSI devices
URI https://ieeexplore.ieee.org/document/6468950
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwELVKT3BhaRG7fOBI0jiLl3NF1SIKiFLRWxXbEymiSlGbCJWvx07SFhAHbkkucRzLM2_mvWeErs0aMSCAa0dKbgCKkpEjWCwdzWx01l6khRUKDx9ofxzeTaJJA91stDAAUJLPwLWXZS9fz1VhS2UdGlIuLEDfYUJUWq1tPcVgmzJVqcGW7cBVHWXP4TwkpaiLssCgMOGvvZ7qe1a3O4knOoPB86tlfPlu_bYfx66UUae3j4br8VZkkze3yKWrPn9ZOf73gw5Qe6vvw0-byHWIGpAdob1v1oQt1KuqDaDxAmZpZea9wvMEG3ANsxVefqR5ScPE3eHjCKt0oYo0X-I0w-P70QBrKLegNhr3bl-6fac-c8FJTSKRO6A9JmgcaBIpEgMHopiOdWxtdhLixzoEnWhfBtbdGDQQ4AHXyiSOyvcBWHCMmtk8gxOEY0lCprxYWpFmxIWkjAiT0EhKFYGEnqKWnZHpe2WrMa0n4-zvx-do1_6Vikd3gZr5ooBLkw_k8qpcCF9H9a1c
link.rule.ids 310,311,783,787,792,793,799,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT8IwFG4IHtSLP8D42x48urHuR9udiYQpoBGI3MjaPpJFAga2GPzrbbcBajx423ZZ1zV93_fe-74idKvXiCYBXFlCcE1QpAiskMXCUsxEZ-UEKjRC4W6Ptof-wygYVdDdRgsDAHnzGdjmMq_lq7nMTKqsQX3KQ0PQdzSu5rRQa20zKprd5GClpFumBlfUlB2Lc5_ksi7KPM3DQnft9lTes7LgSZywEUUvr6bny7XL9_04eCWPO60D1F2PuGg3ebOzVNjy85eZ438_6RDVtwo__LyJXUeoArNjtP_NnLCGWkW-ARRewDQp7LxXeD7Bml7DdIWXH0maN2LiZvepj2WykFmSLnEyw8NOP8IK8k2ojoat-0GzbZWnLliJhhKpBcphIY09RQJJYuBAJFOxio3RzoS4sfJBTZQrPONvDAoIcI8rqaGjdF0A5p2g6mw-g1OEY0F8Jp1YGJlmwENBGQk1pBGUSgITeoZqZkbG74WxxricjPO_H9-g3fag2xl3ot7jBdozf6joqrtE1XSRwZVGB6m4zhfFF4-4sKc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2012+IEEE+International+Integrated+Reliability+Workshop+Final+Report&rft.atitle=Improved+reliability+of+rarely+switching+CMOS+circuits+in+ULSI+devices&rft.au=Sofer%2C+S.&rft.au=Livshits%2C+P.&rft.au=Priel%2C+M.&rft.date=2012-10-01&rft.pub=IEEE&rft.isbn=9781467327497&rft.issn=1930-8841&rft.eissn=2374-8036&rft.spage=179&rft.epage=182&rft_id=info:doi/10.1109%2FIIRW.2012.6468950&rft.externalDocID=6468950
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1930-8841&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1930-8841&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1930-8841&client=summon