Yang, K., Dong, Q., Wang, Z., Shih, Y., Chih, Y., Chang, J., . . . Svlvester, D. (2018, June). A 28NM Integrated True Random Number Generator Harvesting Entropy from MRAM. 2018 IEEE Symposium on VLSI Circuits, 171-172. https://doi.org/10.1109/VLSIC.2018.8502431
Chicago Style (17th ed.) CitationYang, Kaiyuan, Qing Dong, Zhehong Wang, Yi-Chun Shih, Yu-Der Chih, Jonathan Chang, David Blaauw, and Dennis Svlvester. "A 28NM Integrated True Random Number Generator Harvesting Entropy from MRAM." 2018 IEEE Symposium on VLSI Circuits Jun. 2018: 171-172. https://doi.org/10.1109/VLSIC.2018.8502431.
MLA (9th ed.) CitationYang, Kaiyuan, et al. "A 28NM Integrated True Random Number Generator Harvesting Entropy from MRAM." 2018 IEEE Symposium on VLSI Circuits, Jun. 2018, pp. 171-172, https://doi.org/10.1109/VLSIC.2018.8502431.