Further generalized four-port de-embedding method by dropping ideality assumptions on the THROUGH structure

Four-port on-wafer de-embedding is necessary for on-wafer measurement at frequencies above 50 GHz. We found notable discrepancy between the Y-parameters de-embedded using different options provided by a recently published general four-port de-embedding algorithm to solve the four-port Y-parameter ma...

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Bibliographic Details
Published in2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) pp. 184 - 187
Main Authors Kejun Xia, Guofu Niu, Xiaoyun Wei
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.01.2010
Subjects
4-port network
Calibration
Chromium
Deembedding
Electric variables measurement
Frequency measurement
Impedance
Measurement standards
Microwave measurements
microwave on-wafer measurements
Microwave transistors
Scattering parameters
Testing
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Summary:Four-port on-wafer de-embedding is necessary for on-wafer measurement at frequencies above 50 GHz. We found notable discrepancy between the Y-parameters de-embedded using different options provided by a recently published general four-port de-embedding algorithm to solve the four-port Y-parameter matrices. The problem is caused by the ideality assumptions on the internal THROUGH test structure. In this paper, we develop a further generalized algorithm that drops any ideality assumption except passivity on the THROUGH structure. The new method works for transistor S-parameters with or without Impedance Standard Substrate calibration.
ISBN:1424454565
9781424454563
DOI:10.1109/SMIC.2010.5422976