Texture Defect Detection Using Independent Vector Analysis in Wavelet Domain

• Published in: International Conference on Pattern Recognition pp. 1639 - 1644
• Main Authors: Sari, Leda, Ertuzun, Aysin
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.08.2014
• Subjects: Accuracy; independent component analysis; Independent vector analysis; Indexes; texture analysis; Training; Vectors; Wavelet analysis; wavelet transform; Wavelet transforms

In this paper, we address the problem of defect detection in textile images, and present a novel hybrid method where independent vector analysis, a statistical method, is combined with wavelet transformation, a spectral method. Independent vector analysis, a generalization of independent component a...