Study of N-Detectability in QCA Designs

• Published in: 2006 15th Asian Test Symposium pp. 183 - 188
• Main Author: Sikdar, B.K.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.11.2006
• Subjects: Circuit analysis; Circuit faults; CMOS logic circuits; Fault diagnosis; gate; Logic circuits; Majority; N-detectability; Quantum cellular automata; Quantum dots; Quantum-Dot Cellular Automata; Semiconductor device modeling; Testing; Testing of QCA designs; Very large scale integration

QCA (quantum dot cellular automata) are projected as the replacement of state-of-the-art CMOS designs. The wide acceptance of QCA based design of logic circuits demands analysis and estimation of defect coverage in such circuits. Conventional single stuck-at fault model has been commonly employed to...