Study of N-Detectability in QCA Designs - Sikdar, B.K. (2006 15th Asian Test Symposium, 2006)
Keywords: Circuit analysis; Circuit faults; CMOS logic circuits; Fault diagnosis; gate; Logic circuits; Majority; N-detectability; Quantum cellular automata; Quantum dots; Quantum-Dot Cellular Automata; Semiconductor device modeling; Testing; Testing of QCA designs; Very large scale integration