APA (7th ed.) Citation

Kong, Y., & Ni, D. (2017, August). A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits. 2017 13th IEEE Conference on Automation Science and Engineering (CASE), 744-749. https://doi.org/10.1109/COASE.2017.8256193

Chicago Style (17th ed.) Citation

Kong, Yuting, and Dong Ni. "A Practical Yield Prediction Approach Using Inline Defect Metrology Data for System-on-chip Integrated Circuits." 2017 13th IEEE Conference on Automation Science and Engineering (CASE) Aug. 2017: 744-749. https://doi.org/10.1109/COASE.2017.8256193.

MLA (9th ed.) Citation

Kong, Yuting, and Dong Ni. "A Practical Yield Prediction Approach Using Inline Defect Metrology Data for System-on-chip Integrated Circuits." 2017 13th IEEE Conference on Automation Science and Engineering (CASE), Aug. 2017, pp. 744-749, https://doi.org/10.1109/COASE.2017.8256193.