Close-in Phase Noise of a Digitally Tuned VCO

• Published in: 2006 49th IEEE International Midwest Symposium on Circuits and Systems Vol. 1; pp. 51 - 55
• Main Authors: Yang, Long, Pedrotti, Ken
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.08.2006
• Subjects: Analytical models; Delta-sigma modulation; Digital control; Digital modulation; Frequency; Phase locked loops; Phase modulation; Phase noise; Tuning; Voltage-controlled oscillators

Here we present analysis and simulation of the close-in phase noise of a digitally tuned VCO, tunable only in discrete frequency steps. By rapidly tuning between two closely spaced discrete frequencies with a variable duty cycle any average frequency can be achieved. This process will result in incr...