Part-based statistical models for object classification and detection

• Published in: 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) Vol. 2; pp. 734 - 740 vol. 2
• Main Authors: Bernstein, E.J., Amit, Y.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2005
• Subjects: Character recognition; Degradation; Layout; Machine vision; Object detection; Photometry; Robustness; Scalability; Statistics; Training data

We propose using simple mixture models to define a set of mid-level binary local features based on binary oriented edge input. The features capture natural local structures in the data and yield very high classification rates when used with a variety of classifiers trained on small training sets, ex...