Embedded flash testing: overview and perspectives - Ginez, O.; Daga, J.-M.; Girard, P.; Landrault, C.; Pravossoudovitch, S.; Virazel, A. (2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings, 2006)
Keywords: Failure analysis; Flash memory; Logic testing; Nonvolatile memory; Parallel programming; Random access memory; Tunneling; Uniform resource locators; Variable structure systems; Voltage control