Temperature dependence of peak drift velocity and threshold field in n-In0.53Ga0.47As

The peak drift velocity (v p ) and the threshold field (E t ) for negative differential mobility in In 0.53 Ga 0.47 As are calculated in the temperature range of 125-400 K using the Monte Carlo technique. With an increase of temperature, E t increases but v p decreases for a pure as well as for an i...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on electron devices Vol. 31; no. 12; pp. 1918 - 1919
Main Authors Bhattacharyya, A., Ghosal, A., Chattopadhyay, D.
Format Journal Article
LanguageEnglish
Published IEEE 01.01.1984
Online AccessGet full text

Cover

Loading…
Abstract The peak drift velocity (v p ) and the threshold field (E t ) for negative differential mobility in In 0.53 Ga 0.47 As are calculated in the temperature range of 125-400 K using the Monte Carlo technique. With an increase of temperature, E t increases but v p decreases for a pure as well as for an impure material. E t is smaller and v p is larger than the corresponding quantities in GaAs.
AbstractList The peak drift velocity (v p ) and the threshold field (E t ) for negative differential mobility in In 0.53 Ga 0.47 As are calculated in the temperature range of 125-400 K using the Monte Carlo technique. With an increase of temperature, E t increases but v p decreases for a pure as well as for an impure material. E t is smaller and v p is larger than the corresponding quantities in GaAs.
Author Ghosal, A.
Bhattacharyya, A.
Chattopadhyay, D.
Author_xml – sequence: 1
  givenname: A.
  surname: Bhattacharyya
  fullname: Bhattacharyya, A.
  organization: Institute of Radio Physics and Electronics, Calcutta, India
– sequence: 2
  givenname: A.
  surname: Ghosal
  fullname: Ghosal, A.
– sequence: 3
  givenname: D.
  surname: Chattopadhyay
  fullname: Chattopadhyay, D.
BookMark eNotjEFPwjAYQBuDiYCePXjpH-jst7br1yNBRBISL-NMyvo1VKFbtmnCv5dELu_lXd6MTXKbibFnkAWAdK-1WL0V4FAXJSBUd2wKxljhKl1N2FRKQOEUqgc2G4ava1Zal1O2q-ncUe_Hn554oI5yoNwQbyPvyH_z0Kc48l86tU0aL9znwMdjT8OxPQUeE12ZMs9ik2Vh1NrLQtvF8Mjuoz8N9HTznO3eV_XyQ2w_15vlYisSWDMKX6JFxIgWyDlnjYs2RG0wBG0MQECJqiHwDRhEwMr7WKrDwcqIvlRRzdnL_zcR0b7r09n3lz1o1CBB_QGxKU9p
CODEN IETDAI
ContentType Journal Article
DOI 10.1109/T-ED.1984.21816
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1557-9646
EndPage 1919
ExternalDocumentID 1484101
Genre orig-research
GroupedDBID -~X
.DC
0R~
29I
3EH
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACKIV
ACNCT
AENEX
AETIX
AI.
AIBXA
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
B-7
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RIG
RNS
TAE
TN5
VH1
VJK
VOH
XFK
ID FETCH-LOGICAL-i175t-a287888f871e999759f7df458dd45511d8083ce1ac1588186aaf23bb70f8a23f3
IEDL.DBID RIE
ISSN 0018-9383
IngestDate Wed Jun 26 19:25:47 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 12
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-a287888f871e999759f7df458dd45511d8083ce1ac1588186aaf23bb70f8a23f3
PageCount 2
ParticipantIDs ieee_primary_1484101
PublicationCentury 1900
PublicationDate 1984-01-01
PublicationDateYYYYMMDD 1984-01-01
PublicationDate_xml – month: 01
  year: 1984
  text: 1984-01-01
  day: 01
PublicationDecade 1980
PublicationTitle IEEE transactions on electron devices
PublicationTitleAbbrev TED
PublicationYear 1984
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0016442
Score 1.3149848
Snippet The peak drift velocity (v p ) and the threshold field (E t ) for negative differential mobility in In 0.53 Ga 0.47 As are calculated in the temperature range...
SourceID ieee
SourceType Publisher
StartPage 1918
Title Temperature dependence of peak drift velocity and threshold field in n-In0.53Ga0.47As
URI https://ieeexplore.ieee.org/document/1484101
Volume 31
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ07b8IwEMctytQOfdGqb3noWIc4seNkRC2UVqITSGzo4oeEkAKCsPTT95wE1FYdukWZLF-i-93rf4Q8JsakPDYJMxnimxARMEgjwVQiOCAi5Bp8vmP0kQwn4n0qpy3ytJ-FsdZWzWc28I9VLd8s9danyrqI7oL7Ya0DlWX1rNa-YoB-vVYG5_gDY9jVyPjwMOuOWf8lwOBaBN6fJT_2qFRuZHBCRrsD1N0ji2Bb5oH-_KXN-N8TnpLjhidpr_4AzkjLFufk6JvKYIdMxhbZuNZOprult9rSpaMrCwtq1nNXUt87pBHJKRSGlmjhjS9M0arDjc4LWrC3Igxk_AphIFRvc0Emg_74eciabQpsjohQMsDYCMNdhxGSRSpUMnPKOCFTYwRiEzcp0pi2HDSXqde5A3BRnOcqdClEsYsvSbtYFvaKUFDKQKicNDwTqc7AAYJGnuZSSxuZ8Jp0_NXMVrVgxqy5lZu_X9-SQ2-cOq9xR9rlemvv0dOX-UNl4i-wIqVQ
link.rule.ids 315,783,787,799,27936,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjZ07T8MwEMetCgZg4FUQbzwwkjRO7NgZK2hpoe2USt0qxw-pqpRWbbrw6TknaQWIgS3KZPkS3e9e_0PoKdZakEjHnk4A3ygNpSdFSD0eUyIBETIlXb5jOIp7Y_o-YZMGet7NwhhjyuYz47vHspavF2rjUmUtQHdK3LDWPnC1iKtprV3NADx7pQ1O4BeGwKsW8iFB0kq9zqsP4TX1nUeLf2xSKR1J9wQNt0eo-kfm_qbIfPX5S53xv2c8Rcc1UeJ29QmcoYbJz9HRN53BJhqnBui4Uk_G27W3yuCFxUsj51ivZrbArntIAZRjmWtcgI3XrjSFyx43PMtx7vXzwGfRmwx8ytvrCzTudtKXnlfvU_BmAAmFJyE6goDXQoxkgAs5SyzXljKhNQVwIloAjylDpCJMOKU7KW0YZRkPrJBhZKNLtJcvcnOFsORcy4BbpklChUqklYAamciYYibUwTVququZLivJjGl9Kzd_v35EB710OJgO-qOPW3ToDFVlOe7QXrHamHvw-0X2UJr7C4ePqJs
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Temperature+dependence+of+peak+drift+velocity+and+threshold+field+in+n-In0.53Ga0.47As&rft.jtitle=IEEE+transactions+on+electron+devices&rft.au=Bhattacharyya%2C+A.&rft.au=Ghosal%2C+A.&rft.au=Chattopadhyay%2C+D.&rft.date=1984-01-01&rft.pub=IEEE&rft.issn=0018-9383&rft.eissn=1557-9646&rft.volume=31&rft.issue=12&rft.spage=1918&rft.epage=1919&rft_id=info:doi/10.1109%2FT-ED.1984.21816&rft.externalDocID=1484101
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9383&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9383&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9383&client=summon