Polarization Effect of a PMT-like Avalanche Photodiode Based on GaN/AlN Periodic Stack Structure
APD based on AlN/GaN periodically stacked structure (PSS) has been proposed to obtain a high ionization coefficient ratio of more than 100 and a record high linear-mode gain of 10 4 . Here the full p-i-p-i-n SAM structure of the PSS APD is simulated to discuss the influence of the polarization effec...
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Published in | 2018 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) pp. 109 - 110 |
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Format | Conference Proceeding |
Language | English |
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IEEE
01.11.2018
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Abstract | APD based on AlN/GaN periodically stacked structure (PSS) has been proposed to obtain a high ionization coefficient ratio of more than 100 and a record high linear-mode gain of 10 4 . Here the full p-i-p-i-n SAM structure of the PSS APD is simulated to discuss the influence of the polarization effect which cannot be ignored. The dependence of the device performances on polarization effect and structure parameters in the PSS APD is studied in detail, which will be helpful for the design and optimization of PSS APD. |
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AbstractList | APD based on AlN/GaN periodically stacked structure (PSS) has been proposed to obtain a high ionization coefficient ratio of more than 100 and a record high linear-mode gain of 10 4 . Here the full p-i-p-i-n SAM structure of the PSS APD is simulated to discuss the influence of the polarization effect which cannot be ignored. The dependence of the device performances on polarization effect and structure parameters in the PSS APD is studied in detail, which will be helpful for the design and optimization of PSS APD. |
Author | Li, Qian Jian, Zhang Kang, Jianbin Chen, Feiliang Li, Mo Wang, Wangping |
Author_xml | – sequence: 1 givenname: Qian surname: Li fullname: Li, Qian organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China – sequence: 2 givenname: Feiliang surname: Chen fullname: Chen, Feiliang organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China – sequence: 3 givenname: Mo surname: Li fullname: Li, Mo organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China – sequence: 4 givenname: Jianbin surname: Kang fullname: Kang, Jianbin organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China – sequence: 5 givenname: Wangping surname: Wang fullname: Wang, Wangping organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China – sequence: 6 givenname: Zhang surname: Jian fullname: Jian, Zhang organization: Microsystem & Terahertz Research Center of China Academy of Engineering Physics, Institute of Electronic Engineering of China Academy of Engineering Physics, Chendu, China |
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Snippet | APD based on AlN/GaN periodically stacked structure (PSS) has been proposed to obtain a high ionization coefficient ratio of more than 100 and a record high... |
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StartPage | 109 |
SubjectTerms | Absorption Avalanche photodiodes Electric fields Gallium nitride GaN/AlN Ionization linear mode Periodic structures Physics Polarization SAM |
Title | Polarization Effect of a PMT-like Avalanche Photodiode Based on GaN/AlN Periodic Stack Structure |
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