Fault tree analysis using stochastic logic: A reliable and high speed computing

Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in wh...

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Published in2011 Proceedings - Annual Reliability and Maintainability Symposium pp. 1 - 6
Main Authors Aliee, H, Zarandi, H R
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.01.2011
Subjects
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ISBN9781424488575
1424488575
ISSN0149-144X
DOI10.1109/RAMS.2011.5754466

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Abstract Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in which the quantity of `1' bits is proportional to the evaluated number. In addition, using stochastic logic-based circuits to analyze fault-trees makes the circuits reliable against possible fau lts in the computation circuitry. Moreover, stochastic logic-based fault-tree analysis is fast, since both static and dynamic fau lt tree gates can be easily mapped to their equivalents in stochastic logic, and then be implemented on hardware. The method is based on Monte Carlo algorithm, in which, the failure rates of basic components of a given system are computed at different time slots. At the next step, the whole system's failure rate could be calculated using the stochastic circuitry implemented on hardware. Repeating the experiments for several time slots, results in the reliability-time plot of the system. The experimental results show that this technique is fast and reliable, with negligible calculation error.
AbstractList Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in which the quantity of `1' bits is proportional to the evaluated number. In addition, using stochastic logic-based circuits to analyze fault-trees makes the circuits reliable against possible fau lts in the computation circuitry. Moreover, stochastic logic-based fault-tree analysis is fast, since both static and dynamic fau lt tree gates can be easily mapped to their equivalents in stochastic logic, and then be implemented on hardware. The method is based on Monte Carlo algorithm, in which, the failure rates of basic components of a given system are computed at different time slots. At the next step, the whole system's failure rate could be calculated using the stochastic circuitry implemented on hardware. Repeating the experiments for several time slots, results in the reliability-time plot of the system. The experimental results show that this technique is fast and reliable, with negligible calculation error.
Author Aliee, H
Zarandi, H R
Author_xml – sequence: 1
  givenname: H
  surname: Aliee
  fullname: Aliee, H
  email: h.aliee@aut.ac.ir
  organization: Dept. of Comput. Eng. & Inf., Amirkabir Univ. of Technol., Tehran, Iran
– sequence: 2
  givenname: H R
  surname: Zarandi
  fullname: Zarandi, H R
  email: zarandi@aut.ac.ir
  organization: Dept. of Comput. Eng. & Inf., Amirkabir Univ. of Technol., Tehran, Iran
BookMark eNo1kM1Kw0AUhUesYFv7AOJmXiD1zuRmJuOuFKtCpeAPuCuTyU06kiYhM1307a1YV4cD33cWZ8JGbdcSY7cC5kKAuX9bvL7PJQgxz3SGqNQFmwiUiHmeKX3JZkbn_11nIzYGgSYRiF_XbBLCNwBoqWDMNit7aCKPAxG3rW2OwQd-CL6teYid29kQveNNV3v3wBd8oMbbovllS77z9Y6Hnqjkrtv3h3iybthVZZtAs3NO2efq8WP5nKw3Ty_LxTrxQmcxMSbVVFJRCaUMaEEktQaDDmWKuVUqQ7ApOCQoqxOhCifKtJAKK0SpTTpld3-7noi2_eD3djhuz2ekP3QFUf0
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/RAMS.2011.5754466
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISBN 1424488567
9781424488551
1424488559
9781424488568
EndPage 6
ExternalDocumentID 5754466
Genre orig-research
GroupedDBID -~X
29O
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
AAWTH
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
M43
OCL
RIE
RIL
RIO
RNS
ID FETCH-LOGICAL-i175t-9937edebf1669071ee277094c42348a66540a30c4e0df6906bc1d3b264f442793
IEDL.DBID RIE
ISBN 9781424488575
1424488575
ISSN 0149-144X
IngestDate Wed Aug 27 02:46:53 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-9937edebf1669071ee277094c42348a66540a30c4e0df6906bc1d3b264f442793
PageCount 6
ParticipantIDs ieee_primary_5754466
PublicationCentury 2000
PublicationDate 2011-Jan.
PublicationDateYYYYMMDD 2011-01-01
PublicationDate_xml – month: 01
  year: 2011
  text: 2011-Jan.
PublicationDecade 2010
PublicationTitle 2011 Proceedings - Annual Reliability and Maintainability Symposium
PublicationTitleAbbrev RAMS
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0007260
ssj0000669633
Score 1.8405957
Snippet Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms fault tree
Fault trees
Logic gates
Mathematical model
Monte Carlo methods
Monte Carlo Simulation
Reliability
stochastic logic
Stochastic processes
Tunneling magnetoresistance
Title Fault tree analysis using stochastic logic: A reliable and high speed computing
URI https://ieeexplore.ieee.org/document/5754466
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF7anvTioxXf7MGjW_PYZjfeRCxFqIpY6K3sY6LF0paaXPz1zm6SVsWDkEMSkmyyTGbnm8c3hFxESZZFNsxYLLVgPJQpk9KkTKFExyoQwnoS1-FDMhjx-3Fv3CCX61oYAPDJZ9B1uz6WbxemcK4yBO89F35skiaKWVmrtfan4NKJsrTRwiLyFcIOATAEDeO6qEu6lpQ111N9XIU7wyC9ekYAXTJ7VqP9aLviV53-DhnW71smm7x3i1x3zecvKsf_ftAu6Wzq--jTeuXaIw2Y75Ptb9SEbfLYV8Uspy5mTVVFXEJdkvwrRXPRvCnH70y94rymN3QFs6krwsJrLXUUyPRjiU-nxjeNwLs6ZNS_e7kdsKr5ApuiRZEzZ7eABZ2FiQPQIUAkBGJBg_YXl8o1LQ5UHBgOgc0c27E2oY012lcZ5xH-9QekNV_M4ZDQGCSPlQSTWNTLKdcgw8QooQMQGjg_Im03NZNlya8xqWbl-O_TJ2Sr9Ou67ZS08lUBZ2gY5PrcS8QXARGvag
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JT8JAFJ4gHtSLCxh35-DRYpehM_VmjAQV0BhIuJFZXpVIgGB78df7pguo8WDSQ9u0nXbyOu972_cIufDDOPaNFzuBUNxhnogcIXTkSJToQLqcm4zEtdsL2wP2MGwOK-RyWQsDAFnyGTTsbhbLNzOdWlcZGu9NG35cI-uo91kzr9ZaelRQeaI0rdZh7mc1wtYGcNBsGJZlXcI2pSzZnsrjIuDpudHVC5rQObdnMd6PxiuZ3mltk275xnm6yXsjTVRDf_4ic_zvJ-2Q-qrCjz4vddcuqcB0j2x9IyeskaeWTCcJtVFrKgvqEmrT5F8pAkb9Ji3DM82Wzmt6QxcwGdsyLLzWUEuCTD_m-HSqs7YReFedDFp3_du2U7RfcMaIKRLHIhcwoGIvtCa0B-BzjtagRgTGhLRti10ZuJqBa2LLd6y0ZwKFCCtmzMf_fp9Up7MpHBAagGCBFKBDgytzxBQIL9SSKxe4AsYOSc1OzWieM2yMilk5-vv0Odlo97udUee-93hMNnMvr91OSDVZpHCKMCFRZ5l0fAFon7K3
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+Proceedings+-+Annual+Reliability+and+Maintainability+Symposium&rft.atitle=Fault+tree+analysis+using+stochastic+logic%3A+A+reliable+and+high+speed+computing&rft.au=Aliee%2C+H&rft.au=Zarandi%2C+H+R&rft.date=2011-01-01&rft.pub=IEEE&rft.isbn=9781424488575&rft.issn=0149-144X&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FRAMS.2011.5754466&rft.externalDocID=5754466
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0149-144X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0149-144X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0149-144X&client=summon