Fault tree analysis using stochastic logic: A reliable and high speed computing
Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in wh...
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Published in | 2011 Proceedings - Annual Reliability and Maintainability Symposium pp. 1 - 6 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.01.2011
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Online Access | Get full text |
ISBN | 9781424488575 1424488575 |
ISSN | 0149-144X |
DOI | 10.1109/RAMS.2011.5754466 |
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Abstract | Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in which the quantity of `1' bits is proportional to the evaluated number. In addition, using stochastic logic-based circuits to analyze fault-trees makes the circuits reliable against possible fau lts in the computation circuitry. Moreover, stochastic logic-based fault-tree analysis is fast, since both static and dynamic fau lt tree gates can be easily mapped to their equivalents in stochastic logic, and then be implemented on hardware. The method is based on Monte Carlo algorithm, in which, the failure rates of basic components of a given system are computed at different time slots. At the next step, the whole system's failure rate could be calculated using the stochastic circuitry implemented on hardware. Repeating the experiments for several time slots, results in the reliability-time plot of the system. The experimental results show that this technique is fast and reliable, with negligible calculation error. |
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AbstractList | Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to analyze fault trees based on stochastic logic. Applying stochastic logic makes it possible to present floating point numbers as bit streams, in which the quantity of `1' bits is proportional to the evaluated number. In addition, using stochastic logic-based circuits to analyze fault-trees makes the circuits reliable against possible fau lts in the computation circuitry. Moreover, stochastic logic-based fault-tree analysis is fast, since both static and dynamic fau lt tree gates can be easily mapped to their equivalents in stochastic logic, and then be implemented on hardware. The method is based on Monte Carlo algorithm, in which, the failure rates of basic components of a given system are computed at different time slots. At the next step, the whole system's failure rate could be calculated using the stochastic circuitry implemented on hardware. Repeating the experiments for several time slots, results in the reliability-time plot of the system. The experimental results show that this technique is fast and reliable, with negligible calculation error. |
Author | Aliee, H Zarandi, H R |
Author_xml | – sequence: 1 givenname: H surname: Aliee fullname: Aliee, H email: h.aliee@aut.ac.ir organization: Dept. of Comput. Eng. & Inf., Amirkabir Univ. of Technol., Tehran, Iran – sequence: 2 givenname: H R surname: Zarandi fullname: Zarandi, H R email: zarandi@aut.ac.ir organization: Dept. of Comput. Eng. & Inf., Amirkabir Univ. of Technol., Tehran, Iran |
BookMark | eNo1kM1Kw0AUhUesYFv7AOJmXiD1zuRmJuOuFKtCpeAPuCuTyU06kiYhM1307a1YV4cD33cWZ8JGbdcSY7cC5kKAuX9bvL7PJQgxz3SGqNQFmwiUiHmeKX3JZkbn_11nIzYGgSYRiF_XbBLCNwBoqWDMNit7aCKPAxG3rW2OwQd-CL6teYid29kQveNNV3v3wBd8oMbbovllS77z9Y6Hnqjkrtv3h3iybthVZZtAs3NO2efq8WP5nKw3Ty_LxTrxQmcxMSbVVFJRCaUMaEEktQaDDmWKuVUqQ7ApOCQoqxOhCifKtJAKK0SpTTpld3-7noi2_eD3djhuz2ekP3QFUf0 |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/RAMS.2011.5754466 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISBN | 1424488567 9781424488551 1424488559 9781424488568 |
EndPage | 6 |
ExternalDocumentID | 5754466 |
Genre | orig-research |
GroupedDBID | -~X 29O 6IE 6IF 6IH 6IK 6IL 6IM 6IN AAJGR AAWTH ABLEC ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IJVOP IPLJI M43 OCL RIE RIL RIO RNS |
ID | FETCH-LOGICAL-i175t-9937edebf1669071ee277094c42348a66540a30c4e0df6906bc1d3b264f442793 |
IEDL.DBID | RIE |
ISBN | 9781424488575 1424488575 |
ISSN | 0149-144X |
IngestDate | Wed Aug 27 02:46:53 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i175t-9937edebf1669071ee277094c42348a66540a30c4e0df6906bc1d3b264f442793 |
PageCount | 6 |
ParticipantIDs | ieee_primary_5754466 |
PublicationCentury | 2000 |
PublicationDate | 2011-Jan. |
PublicationDateYYYYMMDD | 2011-01-01 |
PublicationDate_xml | – month: 01 year: 2011 text: 2011-Jan. |
PublicationDecade | 2010 |
PublicationTitle | 2011 Proceedings - Annual Reliability and Maintainability Symposium |
PublicationTitleAbbrev | RAMS |
PublicationYear | 2011 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0007260 ssj0000669633 |
Score | 1.8405957 |
Snippet | Fault tree analysis is a widespread-use approach for analyzing reliability and safety in critical systems. In this paper, a new approach is introduced to... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | fault tree Fault trees Logic gates Mathematical model Monte Carlo methods Monte Carlo Simulation Reliability stochastic logic Stochastic processes Tunneling magnetoresistance |
Title | Fault tree analysis using stochastic logic: A reliable and high speed computing |
URI | https://ieeexplore.ieee.org/document/5754466 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEF7anvTioxXf7MGjW_PYZjfeRCxFqIpY6K3sY6LF0paaXPz1zm6SVsWDkEMSkmyyTGbnm8c3hFxESZZFNsxYLLVgPJQpk9KkTKFExyoQwnoS1-FDMhjx-3Fv3CCX61oYAPDJZ9B1uz6WbxemcK4yBO89F35skiaKWVmrtfan4NKJsrTRwiLyFcIOATAEDeO6qEu6lpQ111N9XIU7wyC9ekYAXTJ7VqP9aLviV53-DhnW71smm7x3i1x3zecvKsf_ftAu6Wzq--jTeuXaIw2Y75Ptb9SEbfLYV8Uspy5mTVVFXEJdkvwrRXPRvCnH70y94rymN3QFs6krwsJrLXUUyPRjiU-nxjeNwLs6ZNS_e7kdsKr5ApuiRZEzZ7eABZ2FiQPQIUAkBGJBg_YXl8o1LQ5UHBgOgc0c27E2oY012lcZ5xH-9QekNV_M4ZDQGCSPlQSTWNTLKdcgw8QooQMQGjg_Im03NZNlya8xqWbl-O_TJ2Sr9Ou67ZS08lUBZ2gY5PrcS8QXARGvag |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1JT8JAFJ4gHtSLCxh35-DRYpehM_VmjAQV0BhIuJFZXpVIgGB78df7pguo8WDSQ9u0nXbyOu972_cIufDDOPaNFzuBUNxhnogcIXTkSJToQLqcm4zEtdsL2wP2MGwOK-RyWQsDAFnyGTTsbhbLNzOdWlcZGu9NG35cI-uo91kzr9ZaelRQeaI0rdZh7mc1wtYGcNBsGJZlXcI2pSzZnsrjIuDpudHVC5rQObdnMd6PxiuZ3mltk275xnm6yXsjTVRDf_4ic_zvJ-2Q-qrCjz4vddcuqcB0j2x9IyeskaeWTCcJtVFrKgvqEmrT5F8pAkb9Ji3DM82Wzmt6QxcwGdsyLLzWUEuCTD_m-HSqs7YReFedDFp3_du2U7RfcMaIKRLHIhcwoGIvtCa0B-BzjtagRgTGhLRti10ZuJqBa2LLd6y0ZwKFCCtmzMf_fp9Up7MpHBAagGCBFKBDgytzxBQIL9SSKxe4AsYOSc1OzWieM2yMilk5-vv0Odlo97udUee-93hMNnMvr91OSDVZpHCKMCFRZ5l0fAFon7K3 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+Proceedings+-+Annual+Reliability+and+Maintainability+Symposium&rft.atitle=Fault+tree+analysis+using+stochastic+logic%3A+A+reliable+and+high+speed+computing&rft.au=Aliee%2C+H&rft.au=Zarandi%2C+H+R&rft.date=2011-01-01&rft.pub=IEEE&rft.isbn=9781424488575&rft.issn=0149-144X&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FRAMS.2011.5754466&rft.externalDocID=5754466 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0149-144X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0149-144X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0149-144X&client=summon |