Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity

In this paper, a new method, based on the combination of electromagnetic topology (EMT) and mode matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field cou...

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Bibliographic Details
Published in2009 IEEE International Symposium on Electromagnetic Compatibility pp. 121 - 126
Main Authors Yoon-Mi Park, Younju Lee, Joonho So, Changyul Cheon, Young-Seek Chung, Hyun-Kyo Jung
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2009
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Summary:In this paper, a new method, based on the combination of electromagnetic topology (EMT) and mode matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.
ISBN:9781424442669
1424442664
ISSN:2158-110X
2158-1118
DOI:10.1109/ISEMC.2009.5284664