Revisiting Metric Learning for SPD Matrix Based Visual Representation

• Published in: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) pp. 7111 - 7119
• Main Authors: Luping Zhou, Lei Wang, Jianjia Zhang, Yinghuan Shi, Yang Gao
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.07.2017
• Subjects: Covariance matrices; Eigenvalues and eigenfunctions; Euclidean distance; Learning systems; Visualization

The success of many visual recognition tasks largely depends on a good similarity measure, and distance metric learning plays an important role in this regard. Meanwhile, Symmetric Positive Definite (SPD) matrix is receiving increased attention for feature representation in multiple computer vision...