Vernica, I., Wang, H., & Blaabjerg, F. (2018, September). Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications. IEEE Energy Conversion Congress and Exposition, 4078-4085. https://doi.org/10.1109/ECCE.2018.8558092
Chicago Style (17th ed.) CitationVernica, Ionut, Huai Wang, and Frede Blaabjerg. "Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications." IEEE Energy Conversion Congress and Exposition Sep. 2018: 4078-4085. https://doi.org/10.1109/ECCE.2018.8558092.
MLA (9th ed.) CitationVernica, Ionut, et al. "Impact of Long-Term Mission Profile Sampling Rate on the Reliability Evaluation of Power Electronics in Photovoltaic Applications." IEEE Energy Conversion Congress and Exposition, Sep. 2018, pp. 4078-4085, https://doi.org/10.1109/ECCE.2018.8558092.