Analysis of S-parameters of a coupler based on the partial element equivalent circuit method

Modern electrical devices are of particular concern in terms of EMC. In this paper, a technique to obtain S-parameters using the partial element equivalent circuit (PEEC) method for a four-port coupler structure is presented. Results are compared to method of moments (MoM) solutions. The study perfo...

Full description

Saved in:
Bibliographic Details
Published in2011 International Conference on Electronics, Communications and Control (ICECC) pp. 739 - 742
Main Authors Guorui Cong, Guyan Ni, Jianshu Luo, Jian Dong
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2011
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Modern electrical devices are of particular concern in terms of EMC. In this paper, a technique to obtain S-parameters using the partial element equivalent circuit (PEEC) method for a four-port coupler structure is presented. Results are compared to method of moments (MoM) solutions. The study performed shows that the results obtained through PEEC method agree well with the MoM solutions.
AbstractList Modern electrical devices are of particular concern in terms of EMC. In this paper, a technique to obtain S-parameters using the partial element equivalent circuit (PEEC) method for a four-port coupler structure is presented. Results are compared to method of moments (MoM) solutions. The study performed shows that the results obtained through PEEC method agree well with the MoM solutions.
Author Jian Dong
Guorui Cong
Guyan Ni
Jianshu Luo
Author_xml – sequence: 1
  surname: Guorui Cong
  fullname: Guorui Cong
  email: guoruicong@gmail.com
  organization: Sch. of Sci., Nat. Univ. of Defense Technol. (NUDT), Changsha, China
– sequence: 2
  surname: Guyan Ni
  fullname: Guyan Ni
  organization: Sch. of Sci., Nat. Univ. of Defense Technol. (NUDT), Changsha, China
– sequence: 3
  surname: Jianshu Luo
  fullname: Jianshu Luo
  organization: Sch. of Sci., Nat. Univ. of Defense Technol. (NUDT), Changsha, China
– sequence: 4
  surname: Jian Dong
  fullname: Jian Dong
  organization: Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol. (NUDT), Changsha, China
BookMark eNo1UM1KxDAYjKigu_YF9JIX6JqfJl9yXMqqCwse1JuwpO0XNtI_21TYt7fqOpeZgWEYZkEu2q5FQm45W3HO7P023-T5SjDOV5ppLRWckcSC4ZkCYFJwc04W_4bJK5KM4webobUVANfkfd26-jiGkXaevqS9G1yDEYdf72jZTX2NAy3ciBXtWhoPSOdQDK6mWGODbaT4OYUvV__IMgzlFCKdOw5ddUMuvatHTE68JG8Pm9f8Kd09P27z9S4NHFRMDVTCK1cVft5VFKW3KtOCM1BYZd5YsJmAzPKqQCwdlAyM0sY4AVqiRSGX5O6vNyDivh9C44bj_nSI_AYa4FaI
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICECC.2011.6066357
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore Digital Library
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore Digital Library
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9781457703218
145770319X
1457703211
9781457703195
EndPage 742
ExternalDocumentID 6066357
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i175t-87d2f5adbf006bbcf954621075ed4f8979427491dbeeca7c0785688a2763e9e23
IEDL.DBID RIE
ISBN 1457703203
9781457703201
IngestDate Wed Jun 26 19:27:36 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-87d2f5adbf006bbcf954621075ed4f8979427491dbeeca7c0785688a2763e9e23
PageCount 4
ParticipantIDs ieee_primary_6066357
PublicationCentury 2000
PublicationDate 2011-Sept.
PublicationDateYYYYMMDD 2011-09-01
PublicationDate_xml – month: 09
  year: 2011
  text: 2011-Sept.
PublicationDecade 2010
PublicationTitle 2011 International Conference on Electronics, Communications and Control (ICECC)
PublicationTitleAbbrev ICECC
PublicationYear 2011
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000669277
Score 1.5036622
Snippet Modern electrical devices are of particular concern in terms of EMC. In this paper, a technique to obtain S-parameters using the partial element equivalent...
SourceID ieee
SourceType Publisher
StartPage 739
SubjectTerms Computational modeling
coupler
Couplers
Equivalent circuits
Integrated circuit modeling
Mathematical model
partial element equivalent circuit (PEEC)
S-parameters
Scattering parameters
simulation
Solid modeling
Title Analysis of S-parameters of a coupler based on the partial element equivalent circuit method
URI https://ieeexplore.ieee.org/document/6066357
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFA7bTp5UnPibHDyare2aJjmXjSlMBB3sIIz8eIXibOdoL_71Jmk7UTx4S1II4TXN9_L6vu8hdMviQHKgktBECRID00RxwwnwACRVidYTRxRePCbzZfywoqseuttzYQDAJ5_ByDX9v3xT6tqFysaJx0fWR30mRMPV2sdT7CMRMea5W5QxVxd80kk6tf2wI80EYnyfTtO0UfBsZ_1RXsWjy-wQLbp1NUklb6O6UiP9-Uuy8b8LP0LDbx4fftoj1DHqQXGCXjsdElxm-Jk47e93lxPj-xLrst5uYIcdvBlcFth6iHjrNpjcYGiSzTF81Lndoq6p852u8wo3paiHaDmbvqRz0tZYILl1HCp7GJooo9KozFpQKZ0JGif2GsgomDjjwn6u9t4qQqMAtGTaehQ04VxG9lwCAdHkFA2KsoAzhKNQaxXF1j9RJo6AWuyTnIeBplwGQgXn6MRZZr1tZDTWrVEu_h6-RAdN-Nalc12hQbWr4drif6Vu_Iv_Ao3irGk
link.rule.ids 310,311,783,787,792,793,799,27939,55088
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NS8MwFA9zHvSksonf5uDRbm3XNMm5bEzdhuAGOwgjH69QnO0c7cW_3qQfE8WDt6SFEh4veb-8vt_vIXRHA1cwIMIhoeROAFQ5kmnmAHNBEBkqNbBE4eksHC-CxyVZttD9jgsDAGXxGfTssPyXrzNV2FRZPyzjI91D-8TiioqttcuomJfcp7RkbxFKbWfwQSPqVM-9hjbj8v5DNIyiSsOz_u6PBitlfBkdoWmzsqqs5K1X5LKnPn-JNv536ceo-83kw8-7GHWCWpB20GujRIKzGL84Vv373VbFlHOBVVZs1rDFNsBpnKXYYES8sS4m1hiqcnMMH0VinNQOVbJVRZLjqhl1Fy1Gw3k0duouC05ioENujkPtx0RoGRsLSqliToLQXAQpAR3EjJsNa26u3NMSQAmqDKYgIWPCNycTcPAHp6idZimcIex7Skk_MAhF6sAHYqKfYMxzFWHC5dI9Rx1rmdWmEtJY1Ua5-PvxLToYz6eT1eRh9nSJDqtkri3uukLtfFvAtUEDubwpneALyXmvtg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+International+Conference+on+Electronics%2C+Communications+and+Control+%28ICECC%29&rft.atitle=Analysis+of+S-parameters+of+a+coupler+based+on+the+partial+element+equivalent+circuit+method&rft.au=Guorui+Cong&rft.au=Guyan+Ni&rft.au=Jianshu+Luo&rft.au=Jian+Dong&rft.date=2011-09-01&rft.pub=IEEE&rft.isbn=9781457703201&rft.spage=739&rft.epage=742&rft_id=info:doi/10.1109%2FICECC.2011.6066357&rft.externalDocID=6066357
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457703201/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457703201/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781457703201/sc.gif&client=summon&freeimage=true