Time-of-flight depth image denoising using prior noise information - Edeler, T; Ohliger, K; Hussmann, S; Mertins, A (IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS, 2010)
Keywords: Cameras; Denoising; Multiresolution analysis; Noise reduction; Non-Local-Means; Pixel; PSNR; Time-Of-Flight; Wavelet; Wavelet transforms