Learning to See in the Dark

• Published in: 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition pp. 3291 - 3300
• Main Authors: Chen, Chen, Chen, Qifeng, Xu, Jia, Koltun, Vladlen
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.06.2018
• Subjects: Cameras; Colored noise; Image color analysis; Noise reduction; Pipelines
• ISSN: 1063-6919
• DOI: 10.1109/CVPR.2018.00347

Imaging in low light is challenging due to low photon count and low SNR. Short-exposure images suffer from noise, while long exposure can induce blur and is often impractical. A variety of denoising, deblurring, and enhancement techniques have been proposed, but their effectiveness is limited in ext...