Blight segmentation on corn crop leaf using connected component extraction and CIELAB color space transformation

Interpretation of human to identify the disease on corn crop is must be tested in laboratory to get more accurate result. Disease infection is caused by microorganism in the leaf of corn crop makes a huge loss in the harvest of corn. Identification of blight in leaf of corn crop can be helped by seg...

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Published in2017 International Seminar on Application for Technology of Information and Communication (iSemantic) pp. 205 - 208
Main Authors Sukmana, Septian Enggar, Rahmanti, Farah Zakiyah
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2017
Subjects
Agriculture
bioinformatic
blight square area
CIE a
Diseases
Feature extraction
Image color analysis
Image segmentation
Labeling
labelling
Seminars
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Abstract Interpretation of human to identify the disease on corn crop is must be tested in laboratory to get more accurate result. Disease infection is caused by microorganism in the leaf of corn crop makes a huge loss in the harvest of corn. Identification of blight in leaf of corn crop can be helped by segmentation process. One of solution is exploiting transformation of RGB color space to CIElab to make a same image perception from different device. This activity uses thirty images of leaf, based on experiment it shows that the most suffering leaf is the tenth data where the largest blight is found in that leaf.
AbstractList Interpretation of human to identify the disease on corn crop is must be tested in laboratory to get more accurate result. Disease infection is caused by microorganism in the leaf of corn crop makes a huge loss in the harvest of corn. Identification of blight in leaf of corn crop can be helped by segmentation process. One of solution is exploiting transformation of RGB color space to CIElab to make a same image perception from different device. This activity uses thirty images of leaf, based on experiment it shows that the most suffering leaf is the tenth data where the largest blight is found in that leaf.
Author Sukmana, Septian Enggar
Rahmanti, Farah Zakiyah
Author_xml – sequence: 1
  givenname: Septian Enggar
  surname: Sukmana
  fullname: Sukmana, Septian Enggar
  email: septian.enggar@dsn.dinus.ac.id
  organization: Inf., Univ. Dian Nuswantoro, Semarang, Indonesia
– sequence: 2
  givenname: Farah Zakiyah
  surname: Rahmanti
  fullname: Rahmanti, Farah Zakiyah
  email: farah.zakiyah@dsn.dinus.ac.id
  organization: Inf., Univ. Dian Nuswantoro, Semarang, Indonesia
BookMark eNotUNtKAzEUjKCgrf0CQfIDXXNpbo_tUnWh6oP1uaSbs-vKbnZJIujfG2rhMGeY4czAmaFLP3pA6J6SglJiHqr37cv6dV-VBSNUFZoJqhW5QDMquJacaEGu0SLGL0IINVILrm7QtOm79jPhCO0APtnUjR7nqceQIYwT7sE2-Dt2vs2i91AncJkNU273CcNPCrY-nVnvcFltd-tN9vsx4DjZGnD2fWzGMJzCb9FVY_sIi_Oeo4_H7b58Xu7enqpyvVt2VIm0FLKmlhnmNFgpBFWMNVw72XDHuSVypahb1YpaCQQyO1Jl3MocGyOsZsbwObr7z-0A4DCFbrDh93B-Cv8DgAtckQ
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ISEMANTIC.2017.8251870
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE/IET Electronic Library
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Agriculture
EISBN 1538630850
9781538630853
EndPage 208
ExternalDocumentID 8251870
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
ABLEC
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
OCL
RIE
RIL
ID FETCH-LOGICAL-i175t-56c1a292d8ea6551722f38d6f3d33a06471d4c71a6e0ed4cb179d49bf95a82993
IEDL.DBID RIE
IngestDate Thu Jun 29 18:37:49 EDT 2023
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-56c1a292d8ea6551722f38d6f3d33a06471d4c71a6e0ed4cb179d49bf95a82993
PageCount 4
ParticipantIDs ieee_primary_8251870
PublicationCentury 2000
PublicationDate 2017-Oct.
PublicationDateYYYYMMDD 2017-10-01
PublicationDate_xml – month: 10
  year: 2017
  text: 2017-Oct.
PublicationDecade 2010
PublicationTitle 2017 International Seminar on Application for Technology of Information and Communication (iSemantic)
PublicationTitleAbbrev ISEMANTIC
PublicationYear 2017
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0001968537
Score 1.7134621
Snippet Interpretation of human to identify the disease on corn crop is must be tested in laboratory to get more accurate result. Disease infection is caused by...
SourceID ieee
SourceType Publisher
StartPage 205
SubjectTerms Agriculture
bioinformatic
blight square area
CIE a
Diseases
Feature extraction
Image color analysis
Image segmentation
Labeling
labelling
Seminars
Title Blight segmentation on corn crop leaf using connected component extraction and CIELAB color space transformation
URI https://ieeexplore.ieee.org/document/8251870
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT8IwFG-Ak178AON3evDoBtvabj0CgYARYiIk3Ei_Roy4kTku_vW-bhPUeDBZlq5Z05e2e-_3uvd7RehO6lhTqalDGGEOiSR3IsalY4wAjygMWJnseTJlozl5WNBFDd3vuDDGmCL4zLi2WPzL16na2q2ytqVZwvqqo3rIecnV2u-ncAaWJ6xIwF6Ht8fPg0l3Ohv3bQBX6FaNf5yiUhiR4RGafHVfxo68uttcuurjV2bG_8p3jFp7uh5-2hmiE1QzySk67K6yKq-GgadveQebaNNbW58cv5vVW8U9SjBc4InCLUs3eG1EjG1M_AoqQRUrAKbYhp-nCTTAoNGzkhGBRaJxfzx47PawTYCdYVBRIE_-DRCnSQvNh4NZf-RURy84L4Ancocy5Qmf-zoyggGoCn0_DiLN4kAHgbAEVU8TFXqCmY6BkoTvWhMuY05FBBYuOEONBCQ6R5h4HEAEJX5HSaJ5JBXXlGp4T3kaJu4CNe1ILjdldo1lNYiXf1dfoQM7m2U43TVq5NnW3AAsyOVtsR4-AcvkuQg
link.rule.ids 310,311,783,787,792,793,799,27939,55088
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT4MwFG7mPKgXf0zjb3vwKGxAW-hxW7YMHYuJW7LbQmlZjBMWZBf_el8Bt2k8mBBSGpq8tKXve-V9XxG6FzKWVEhqEEaYQTzBDY9xYSgVQkTkOqwUew5GbDAhj1M6raGHNRdGKVUknylTF4t_-TKNVnqrrKlpljC_dtAu1biiZGttdlQ4A9_jVjRgq8Wb_ksvaI_GflencLlm1fzHOSqFG-kfouDbgDJ75M1c5cKMPn9pM_7XwiN0uiHs4ee1KzpGNZWcoIP2PKuUNRQ8bSkPNtCys9BROf5Q8_eKfZRguCAWhVuWLvFChTHWWfFzqITFOAJoinUCeppAAwxrelZyInCYSNz1e8N2B2sJ7AzDIgX25FuQOE1O0aTfG3cHRnX4gvEKiCI3KIus0Oa29FTIAFa5th07nmSxIx0n1BRVS5LItUKmWgpKAr5sSbiIOQ098HHOGaonYNE5wsTiACMosVuRIJJ7IuKSUgnvRZaEgbtADd2Ts2WprzGrOvHy7-o7tDcYB8PZ0B89XaF9PbJlct01qufZSt0ASMjFbTE3vgCm57xV
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2017+International+Seminar+on+Application+for+Technology+of+Information+and+Communication+%28iSemantic%29&rft.atitle=Blight+segmentation+on+corn+crop+leaf+using+connected+component+extraction+and+CIELAB+color+space+transformation&rft.au=Sukmana%2C+Septian+Enggar&rft.au=Rahmanti%2C+Farah+Zakiyah&rft.date=2017-10-01&rft.pub=IEEE&rft.spage=205&rft.epage=208&rft_id=info:doi/10.1109%2FISEMANTIC.2017.8251870&rft.externalDocID=8251870