Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions - Flanigan, E.; Tragoudas, S.; Abdulrahman, A. (2009 27th IEEE VLSI Test Symposium, 2009)
Keywords: Automatic test pattern generation; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Compaction; Data structures; Delay; PDF; Robustness; Test pattern generators