Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time - Yi-Chun Shih; Chia-Fu Lee; Yen-An Chang; Po-Hao Lee; Hon-Jarn Lin; Yu-Lin Chen; Ku-Feng Lin; Ta-Ching Yeh; Hung-Chang Yu; Chuang, Harry; Yu-Der Chih; Chang, Jonathan (2018 IEEE Symposium on VLSI Circuits, 2018)
Keywords: Computer architecture; Current measurement; Electrical resistance measurement; emerging memory; Microprocessors; MRAM; non-volatile memory; Resistance; Sensors; Temperature measurement