Uncertainty-Driven Black-Box Test Data Generation - Walkinshaw, Neil; Fraser, Gordon (ICST 2017 : proceedings : 10th IEEE International Conference on Software Testing, Verification and Validation : 13-17 March, Tokyo, Japan, 2017)
Keywords: black-box testing; Data models; Genetic programming; machine learning; Machine learning algorithms; Software systems; Subspace constraints; test generation; Testing; Uncertainty; uncertainty sampling