A new tool development for the thermal design and quick performance evaluation of FBGA devices

Due to rising thermal concerns from increasing power densities and industry demands for shorter development cycle times, we have developed quick solutions to assess the thermal performance of the FBGA package, one of the most widespread package options. We have designed a user friendly tool that pro...

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Published in2010 11th International Conference on Electronic Packaging Technology and High Density Packaging pp. 698 - 703
Main Authors Siew Hoon Ore, Zhu, W H, Yuan, W L, Suthiwongsunthorn, Nathapong
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.08.2010
Subjects
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ISBN9781424481408
1424481406
DOI10.1109/ICEPT.2010.5582855

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Abstract Due to rising thermal concerns from increasing power densities and industry demands for shorter development cycle times, we have developed quick solutions to assess the thermal performance of the FBGA package, one of the most widespread package options. We have designed a user friendly tool that provides a quick estimation of the junction to ambient thermal resistance of the FBGA package under JEDEC test conditions (JESD 51-2 and JESD 51-6). Results can be obtained within minutes by a click of a button after the simple entry of key package and environmental data. The tool significantly reduces the time for thermal evaluation; from hours or days needed to conduct full Computational Fluid Dynamics (CFD) simulations, to minutes by using the tool. It can also be used for upfront thermal design as it is able to assess the thermal impact due to changes in various package factors such as package size, die size, presence of solder balls under the die area, number and thickness of substrate metallized layers, total substrate thickness and number of thermal vias under the die area. The tool is also able to assess the impact due to changes in wind speed up to 1m/s and test board including both the 1S0P and 2S2P JEDEC PCB. With these features, the tool can be used to quickly estimate if the package specifications meet the desired thermal requirement, and if it fails to meet the requirement, rapidly identify potential package thermal design options. The formulation of the tool was challenging due to large number of factors involved such as the individual package components, environmental parameters and test boards. The complexity was further exacerbated by the complicated interactions between these factors and their impact on thermal performance. A systematic approach was thus designed to tackle these challenges. The formulation begun by the analysis of a large database of CFD simulation studies that were conducted for FBGA production devices. Using Design of Experiments (DOE), additional identified CFD simulations were conducted for a comprehensive assessment of all the factors. Experimental measurements were conducted using selected FBGA production devices under JEDEC still air and forced convection conditions on both 1S0P and 2S2P test boards. CFD simulation results of the selected test vehicles shows excellent agreement with the experimental studies with less than 10% deviations. From the extensive list of package and environmental parameters, key factors with significant thermal impact were identified through DOE and analysis of customized partial factorial results. It is found that the package size, die size, presence of solder balls under the die area and the substrate thermal conductivity are the key package factors with significant impact on the FBGA thermal performance. The FBGA thermal performance was then expressed as a function of these factors. Next, to verify that the key trends are well captured, the tool was then subjected to rigorous testing by comparison with both Computational Fluid Dynamics (CFD) simulation results and experimental measurements. Comparison of results shows that the discrepancies are within 15% under a specified applicable range, with more than 75% of the test results having less than 10% deviations. This paper presents the approach used in the formulation of the tool and the valuable insights on the FBGA package structure and thermal performance thus obtained.
AbstractList Due to rising thermal concerns from increasing power densities and industry demands for shorter development cycle times, we have developed quick solutions to assess the thermal performance of the FBGA package, one of the most widespread package options. We have designed a user friendly tool that provides a quick estimation of the junction to ambient thermal resistance of the FBGA package under JEDEC test conditions (JESD 51-2 and JESD 51-6). Results can be obtained within minutes by a click of a button after the simple entry of key package and environmental data. The tool significantly reduces the time for thermal evaluation; from hours or days needed to conduct full Computational Fluid Dynamics (CFD) simulations, to minutes by using the tool. It can also be used for upfront thermal design as it is able to assess the thermal impact due to changes in various package factors such as package size, die size, presence of solder balls under the die area, number and thickness of substrate metallized layers, total substrate thickness and number of thermal vias under the die area. The tool is also able to assess the impact due to changes in wind speed up to 1m/s and test board including both the 1S0P and 2S2P JEDEC PCB. With these features, the tool can be used to quickly estimate if the package specifications meet the desired thermal requirement, and if it fails to meet the requirement, rapidly identify potential package thermal design options. The formulation of the tool was challenging due to large number of factors involved such as the individual package components, environmental parameters and test boards. The complexity was further exacerbated by the complicated interactions between these factors and their impact on thermal performance. A systematic approach was thus designed to tackle these challenges. The formulation begun by the analysis of a large database of CFD simulation studies that were conducted for FBGA production devices. Using Design of Experiments (DOE), additional identified CFD simulations were conducted for a comprehensive assessment of all the factors. Experimental measurements were conducted using selected FBGA production devices under JEDEC still air and forced convection conditions on both 1S0P and 2S2P test boards. CFD simulation results of the selected test vehicles shows excellent agreement with the experimental studies with less than 10% deviations. From the extensive list of package and environmental parameters, key factors with significant thermal impact were identified through DOE and analysis of customized partial factorial results. It is found that the package size, die size, presence of solder balls under the die area and the substrate thermal conductivity are the key package factors with significant impact on the FBGA thermal performance. The FBGA thermal performance was then expressed as a function of these factors. Next, to verify that the key trends are well captured, the tool was then subjected to rigorous testing by comparison with both Computational Fluid Dynamics (CFD) simulation results and experimental measurements. Comparison of results shows that the discrepancies are within 15% under a specified applicable range, with more than 75% of the test results having less than 10% deviations. This paper presents the approach used in the formulation of the tool and the valuable insights on the FBGA package structure and thermal performance thus obtained.
Author Zhu, W H
Suthiwongsunthorn, Nathapong
Siew Hoon Ore
Yuan, W L
Author_xml – sequence: 1
  surname: Siew Hoon Ore
  fullname: Siew Hoon Ore
  email: SH_Ore@sg.utacgroup.com
  organization: United Test & Assembly Center, Singapore, Singapore
– sequence: 2
  givenname: W H
  surname: Zhu
  fullname: Zhu, W H
  organization: Tian Shui Hua Tian Technol. Co. Ltd., Tianshui, China
– sequence: 3
  givenname: W L
  surname: Yuan
  fullname: Yuan, W L
  organization: United Test & Assembly Center, Singapore, Singapore
– sequence: 4
  givenname: Nathapong
  surname: Suthiwongsunthorn
  fullname: Suthiwongsunthorn, Nathapong
  organization: United Test & Assembly Center, Singapore, Singapore
BookMark eNpVkM1OwzAQhI0ACSh5Abj4BVL8H-cYqrZUqgSHcqVy4jUYErskaSvenkT0wkozo0-7msPeoIsQAyB0R8mUUpI_rGbzl82UkYGl1ExLeYaSPNNUMCEGp_L8HxN9hZKu-yTDCMmYFtforcABjriPscYWDlDHXQOhxy62uP-AUW1jxl3n3wM2weLvva--8A7a4aYxoQIMB1PvTe9jwNHhxeOyGLt8Bd0tunSm7iA55QS9Luab2VO6fl6uZsU69TSTfcqdUrkobW50WbGMOwl2cAAFWqu8sorSjMiqFCwnmWKy5ByIlc5yp42yfILu_3o9AGx3rW9M-7M9fYX_AptNV-Y
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICEPT.2010.5582855
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE/IET Electronic Library (IEL) (UW System Shared)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9781424481415
1424481422
1424481414
9781424481422
EndPage 703
ExternalDocumentID 5582855
Genre orig-research
GroupedDBID 6IE
6IF
6IK
6IL
6IN
AAJGR
AAWTH
ADFMO
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IEGSK
IERZE
OCL
RIE
RIL
ID FETCH-LOGICAL-i175t-3f6694bd9a8bc273f5ed73fee6e8869cd611705cb42907625b33e0d5fd3f8a6d3
IEDL.DBID RIE
ISBN 9781424481408
1424481406
IngestDate Wed Aug 27 03:08:08 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-3f6694bd9a8bc273f5ed73fee6e8869cd611705cb42907625b33e0d5fd3f8a6d3
PageCount 6
ParticipantIDs ieee_primary_5582855
PublicationCentury 2000
PublicationDate 2010-Aug.
PublicationDateYYYYMMDD 2010-08-01
PublicationDate_xml – month: 08
  year: 2010
  text: 2010-Aug.
PublicationDecade 2010
PublicationTitle 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging
PublicationTitleAbbrev ICEPT
PublicationYear 2010
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000452284
Score 1.4473596
Snippet Due to rising thermal concerns from increasing power densities and industry demands for shorter development cycle times, we have developed quick solutions to...
SourceID ieee
SourceType Publisher
StartPage 698
SubjectTerms Atmospheric modeling
Computational fluid dynamics
Data models
Electronic packaging thermal management
Predictive models
Substrates
Thermal factors
Title A new tool development for the thermal design and quick performance evaluation of FBGA devices
URI https://ieeexplore.ieee.org/document/5582855
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB7anjyptOKbPXg0bUyy6-ZYS2sVKj200JNln1AqSSvJxV_vbB4NigcPCXnAsmyyMx8z33wDcBcxX6Ab0bjFdeBF1nKPizD0YtxL1qfCqiKmO3tj02X0uqKrFtwfamGMMQX5zPTdZZHL16nKXahsQF2Oh9I2tPE3K2u1DvGUQhqcR3XtlhNyYrWkU3XP66IZPx68jMbzRcnsqkb90V6l8C6TY5jV8ypJJdt-nsm--vol2fjfiZ9Ar6njI_ODhzqFlkm68D4kCKVJlqYfRDeUIYLolSAadAcaa_fOcTuISDTZ5xu1JbumxoA0IuEktWTy9Dx0Yzmj04PlZLwYTb2qy4K3QeiQeaFlLI6kjgWXCsGMpUbj2RhmOGex0sw1p6FKoufy0XRSGYbG19Tq0HLBdHgGnSRNzDkQq0QgHmNEoEY75yhUwE0UWCdSJuVDcAFdtzbrXSmksa6W5fLvx1dwVKbqHdvuGjrZZ25uEAFk8rb49N8zea0J
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT8JAEJ4gHvSkBoxv9-DRQm276_aIBCwKhAMknCT7TAimRdNe_PXu9kGj8eChTbdNNptNd-bLzHzfANwFxGXGjUhzxKXnBFpThzLfd0JzlrSLmRZ5THcyJdEieFniZQPud1wYpVRefKY69jHP5ctEZDZU1sU2x4PxHuwbvx_ggq21i6jk4uA0qNhbVsqJVKJO5ZhWtBk37I76g9m8qO0q5_3RYCX3L8MjmFQrK8pKNp0s5R3x9Uu08b9LP4Z2zeRDs52POoGGilvw1kMGTKM0Sd6RrIuGkMGvyOBBexlzbb_Z6g7EYok-srXYoG3NMkC1TDhKNBo-PffsXNbstGExHMz7kVP2WXDWBjykjq8JCQMuQ0a5MHBGYyXNXSmiKCWhkMS2p8GCG9_lGuOJue8rV2ItfU0Zkf4pNOMkVmeAtGAeewwNBlXSukcmPKoCT1uZMs4fvHNo2b1ZbQspjVW5LRd_v76Fg2g-Ga_Go-nrJRwWiXtbe3cFzfQzU9cGD6T8Jv8NvgF2lrBW
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2010+11th+International+Conference+on+Electronic+Packaging+Technology+and+High+Density+Packaging&rft.atitle=A+new+tool+development+for+the+thermal+design+and+quick+performance+evaluation+of+FBGA+devices&rft.au=Siew+Hoon+Ore&rft.au=Zhu%2C+W+H&rft.au=Yuan%2C+W+L&rft.au=Suthiwongsunthorn%2C+Nathapong&rft.date=2010-08-01&rft.pub=IEEE&rft.isbn=9781424481408&rft.spage=698&rft.epage=703&rft_id=info:doi/10.1109%2FICEPT.2010.5582855&rft.externalDocID=5582855
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424481408/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424481408/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781424481408/sc.gif&client=summon&freeimage=true