SOI MESFETs for extreme environment buck regulators

• Published in: IEEE 2011 International SOI Conference pp. 1 - 2
• Main Authors: Lepkowski, W., Goryll, M., Wilk, S. J., Zhang, Y., Sochacki, J., Thornton, T. J.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.10.2011
• Subjects: CMOS integrated circuits; Logic gates; MESFETs; Regulators; Schottky diodes; Voltage control; Voltage measurement

The next step to confirm the MESFET's ability to handle extreme environments will be testing the buck regulator in the presence of radiation. These measurements will be completed in the coming month and the results presented at the conference. Eventually the goal will be to integrate the MESFET...