A New Fault Detection Technique for IGBT Based on Gate Voltage Monitoring - Rodriguez, M.A.; Claudio, A.; Theilliol, D.; Vela, L.G. (2007 IEEE Power Electronics Specialists Conference, 2007)
Keywords: Circuit faults; Delay effects; Equations; Failure analysis; Fault detection; Insulated gate bipolar transistors; Monitoring; MOSFET circuits; Signal analysis; Voltage measurement