Semi-automatic copper foil surface roughness detection from PCB microsection images - Soumya De; Gafarov, A.; Koledintseva, M. Y.; Stanley, R. J.; Drewniak, J. L.; Hinaga, S. (2012 IEEE International Symposium on Electromagnetic Compatibility, 2012)
Keywords: Conductors; Copper; Dielectric losses; Rough surfaces; Surface roughness