Sub-wavelength micromachining of silica glass by irradiation of infrared laser with Fresnel diffraction

We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO 2 laser with a spatial resolution down to sub-wavelength scale. Copper grid mask with square apertures of 20×20 μm was attached to the silica glass surface, and the silica glass was i...

Full description

Saved in:
Bibliographic Details
Published inTENCON 2010 - 2010 IEEE Region 10 Conference pp. 1905 - 1908
Main Authors Okazaki, K, Nakamura, D, Okada, T, Niino, H, Torii, S, Makimura, T, Murakami, K, Takahashi, A
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2010
Subjects
Online AccessGet full text

Cover

Loading…
Abstract We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO 2 laser with a spatial resolution down to sub-wavelength scale. Copper grid mask with square apertures of 20×20 μm was attached to the silica glass surface, and the silica glass was irradiated by the TEA CO 2 laser light through the mask. As a result, circular holes were formed on the silica glass surface at the center of the apertures due to the Fresnel diffraction effect, and a minimum diameter of the hole was less than 3 μm. The mechanism of the micromachining was discussed based on the electric field distribution of the CO 2 laser light under the mask, by a 3D full-wave electromagnetic field simulation.
AbstractList We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO 2 laser with a spatial resolution down to sub-wavelength scale. Copper grid mask with square apertures of 20×20 μm was attached to the silica glass surface, and the silica glass was irradiated by the TEA CO 2 laser light through the mask. As a result, circular holes were formed on the silica glass surface at the center of the apertures due to the Fresnel diffraction effect, and a minimum diameter of the hole was less than 3 μm. The mechanism of the micromachining was discussed based on the electric field distribution of the CO 2 laser light under the mask, by a 3D full-wave electromagnetic field simulation.
Author Nakamura, D
Makimura, T
Okazaki, K
Okada, T
Takahashi, A
Murakami, K
Niino, H
Torii, S
Author_xml – sequence: 1
  givenname: K
  surname: Okazaki
  fullname: Okazaki, K
  email: okazaki@laserlab.ees.kyushu-u.ac.jp
  organization: Grad. Sch. of ISEE, Kyushu Univ., Fukuoka, Japan
– sequence: 2
  givenname: D
  surname: Nakamura
  fullname: Nakamura, D
  organization: Grad. Sch. of ISEE, Kyushu Univ., Fukuoka, Japan
– sequence: 3
  givenname: T
  surname: Okada
  fullname: Okada, T
  organization: Grad. Sch. of ISEE, Kyushu Univ., Fukuoka, Japan
– sequence: 4
  givenname: H
  surname: Niino
  fullname: Niino, H
  organization: Nat. Inst. of AIST, Tsukuba, Japan
– sequence: 5
  givenname: S
  surname: Torii
  fullname: Torii, S
  organization: Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
– sequence: 6
  givenname: T
  surname: Makimura
  fullname: Makimura, T
  organization: Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
– sequence: 7
  givenname: K
  surname: Murakami
  fullname: Murakami, K
  organization: Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
– sequence: 8
  givenname: A
  surname: Takahashi
  fullname: Takahashi, A
  organization: Grad. Sch. of Med. Sci., Kyushu Univ., Fukuoka, Japan
BookMark eNo90MtOAjEUBuCqmAjIE7DpCwz2Ou0sDQE1IbAQ16TtnA41Q8e0KOHtHeLlbE5yvj__4ozQIHYREJpSMqOUVA_bxXq-Wc8Y6Q-y1KVg7AqNqGBClFprcY2GjMqq4EKSGzSplP6zSg_-TbA7NMn5nfRTEka0GqLm9dMWJ_MFLcTmuMeH4FJ3MG4fYogN7jzOoQ3O4KY1OWN7xiElUwdzDF28cIg-mQQ17h0SPoW-ZJkgR2hxHXyP7hK9R7fetBkmv3uM3paL7fy5WG2eXuaPqyJQJY8Fs0RyoZzjFCqnBZFW-5IbAtLUYJUzQmultAMjKks8EGlAU2k50RS842M0_ekNALD7SOFg0nn3-zP-Db4jYA4
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/TENCON.2010.5686422
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1424468884
9781424468881
1424468906
9781424468904
EISSN 2159-3450
EndPage 1908
ExternalDocumentID 5686422
Genre orig-research
GroupedDBID 6IE
6IF
6IH
6IK
6IL
6IM
AAJGR
ACGFS
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
CBEJK
CHZPO
IPLJI
M43
OCL
RIE
RIO
ID FETCH-LOGICAL-i175t-2b05347cc31e9c8405b8f63a0e5adeb7ca488778cea49b0fe05ae815b3081efc3
IEDL.DBID RIE
ISBN 9781424468898
1424468892
ISSN 2159-3442
IngestDate Wed Jun 26 19:28:57 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i175t-2b05347cc31e9c8405b8f63a0e5adeb7ca488778cea49b0fe05ae815b3081efc3
PageCount 4
ParticipantIDs ieee_primary_5686422
PublicationCentury 2000
PublicationDate 2010-Nov.
PublicationDateYYYYMMDD 2010-11-01
PublicationDate_xml – month: 11
  year: 2010
  text: 2010-Nov.
PublicationDecade 2010
PublicationTitle TENCON 2010 - 2010 IEEE Region 10 Conference
PublicationTitleAbbrev TENCON
PublicationYear 2010
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000602087
ssj0000507093
Score 1.4796716
Snippet We investigated a simple and productive micromachining method of silica glass by the ablation using a 10.6 μm TEA CO 2 laser with a spatial resolution down to...
SourceID ieee
SourceType Publisher
StartPage 1905
SubjectTerms Apertures
CO2 laser
Copper
Fresnel diffraction
Glass
Laser ablation
metal mask
Micromachining
silica glass
Silicon compounds
Title Sub-wavelength micromachining of silica glass by irradiation of infrared laser with Fresnel diffraction
URI https://ieeexplore.ieee.org/document/5686422
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELZKJyZALeItD4y4TeI4cWbUqkKiYmilbpXtXkoFpCikQvDruXPSIhADWxJHSuL4cY_v-46xa8q8mFyGIlMQiTi2TmgXSyFtjt6C1aYm0t6Pk9E0vpupWYvd7LgwAODBZ9CjQ5_LX6zdhkJlfZVoNJdxwd1Ls6zmau3iKQEaNkEz1upVmMpPElsaN7VMyNh77Z7XlWidRVu5p-ZcN4pEYZD1JwP0p8c17Kt55I_aK37rGR6w--1L14iTp96msj33-UvP8b9fdci63yQ__rDbvo5YC4oOW-JCIt4NVaMoltUjf_F4PQ-4xJv4OudvKwrzcW91c_vBV2VJ8gb0f6kZB2xJmHaO7VByCvPyIbr0BTxzKsZS1kSKLpsOB5PbkWhqMYgVGhiViCzO1jh1ToaQOfQKldV5Ik0AyizApiSOrtNUOzBxZoMcAmVAh8pKtDkgd_KYtYt1ASeMWyO1NVGOUz-lLCKVOiOtZFDKERDrlHWok-avtdzGvOmfs78vn7N9n9D39MAL1q7KDVyinVDZKz9AvgDGF7YD
link.rule.ids 310,311,783,787,792,793,799,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT8IwFG-IHvSkBozf9uDR4qDr1p0NBBWIB0i8kba8IVGHmSNG_3rf6wZG48Hbti776Lr2ffx-v8fYBWVeTCpbIlHQFmFondAulELaFL0Fq01JpB0Mo944vH1QDzV2uebCAIAHn0GTNn0uf7pwSwqVXalIo7mME-4mXkFHJVtrHVEJ0LQJqtFWzsNUgJL40risJUKG3m_3zK5I66S9Enyq9nWlSdQKkqtRBz3qYQn8qm76o_qKX3y6O2yweuwSc_LUXBa26T5_KTr-9712WeOb5sfv1wvYHqtBVmcznErEu6F6FNmseOQvHrHnIZd4El-k_G1OgT7u7W5uP_g8z0nggL4wNeOQzQnVzrEdck6BXt5Fpz6DZ07lWPKSStFg425ndN0TVTUGMUcToxBti_9rGDsnW5A49AuV1WkkTQDKTMHGJI-u41g7MGFigxQCZUC3lJVodUDq5D7byBYZHDBujdTWtFP8-WPKI1KxM1JLBqUcQbEOWZ06afJaCm5Mqv45-vvwOdvqjQb9Sf9meHfMtn1635MFT9hGkS_hFK2Gwp75wfIFfmO5Tg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=TENCON+2010+-+2010+IEEE+Region+10+Conference&rft.atitle=Sub-wavelength+micromachining+of+silica+glass+by+irradiation+of+infrared+laser+with+Fresnel+diffraction&rft.au=Okazaki%2C+K&rft.au=Nakamura%2C+D&rft.au=Okada%2C+T&rft.au=Niino%2C+H&rft.date=2010-11-01&rft.pub=IEEE&rft.isbn=9781424468898&rft.issn=2159-3442&rft.eissn=2159-3450&rft.spage=1905&rft.epage=1908&rft_id=info:doi/10.1109%2FTENCON.2010.5686422&rft.externalDocID=5686422
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2159-3442&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2159-3442&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2159-3442&client=summon