Space Program Scheme for 3-D NAND Flash Memory Specialized for the TLC Design - Kang, Ho-Jung; Choi, Nagyong; Lee, Dong Hwan; Lee, Tackhwi; Chung, Sungyong; Bae, Jong-Ho; Park, Byung-Gook; Lee, Jong-Ho (2018 IEEE Symposium on VLSI Technology, 2018)
Keywords: Aerospace electronics; Electron traps; Erbium; Flash memories; Logic gates; Timing; Very large scale integration