Using Security and Dependability Patterns for Reaction Processes

• Published in: 2008 19th International Workshop on Database and Expert Systems Applications pp. 315 - 319
• Main Authors: Di Giacomo, V., Felici, M., Meduri, V., Presenza, D., Riccucci, C., Tedeschi, A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.09.2008
• Subjects: Air traffic control; Asynchronous transfer mode; Industries; Monitoring; Prototypes; Runtime; Security

Security and dependability (S&D) patterns support the structuring and reusing of design solutions to specific known problems. They capture S&D features and support reusing strategies across 'similar' design problems. Despite the fact that they simplify the analysis and implementati...