Design of reliability demonstration testing for repairable systems
Reliability Demonstration Testing (RDT) for non-repairable systems has been successfully implemented in many industries, such as microelectronics, aerospace and healthcare. In designing RDTs, the famous beta-binomial formula is often applied to determine the necessary sample size so that the require...
Saved in:
Published in | 2011 Proceedings - Annual Reliability and Maintainability Symposium pp. 1 - 6 |
---|---|
Main Authors | , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.01.2011
|
Subjects | |
Online Access | Get full text |
ISBN | 9781424488575 1424488575 |
ISSN | 0149-144X |
DOI | 10.1109/RAMS.2011.5754441 |
Cover
Loading…
Abstract | Reliability Demonstration Testing (RDT) for non-repairable systems has been successfully implemented in many industries, such as microelectronics, aerospace and healthcare. In designing RDTs, the famous beta-binomial formula is often applied to determine the necessary sample size so that the required reliability metric at a given confidence level can be demonstrated. However, many systems, such as cars and combine harvesters, are repairable systems. For repairable systems, RDT design methods have been developed mainly for Homogeneous Poisson Processes (HPP). This paper provides a new RDT design method applicable for both HPP and Non-Homogeneous Poisson Process (NHPP) cases. The result shows that the proposed method can effectively determine the required testing time and sample size of test units to demonstrate the required Mean Time Between Failures (MTBF). A comparison study is also conducted to illustrate the superior performance of the proposed method over some of the existing methods. |
---|---|
AbstractList | Reliability Demonstration Testing (RDT) for non-repairable systems has been successfully implemented in many industries, such as microelectronics, aerospace and healthcare. In designing RDTs, the famous beta-binomial formula is often applied to determine the necessary sample size so that the required reliability metric at a given confidence level can be demonstrated. However, many systems, such as cars and combine harvesters, are repairable systems. For repairable systems, RDT design methods have been developed mainly for Homogeneous Poisson Processes (HPP). This paper provides a new RDT design method applicable for both HPP and Non-Homogeneous Poisson Process (NHPP) cases. The result shows that the proposed method can effectively determine the required testing time and sample size of test units to demonstrate the required Mean Time Between Failures (MTBF). A comparison study is also conducted to illustrate the superior performance of the proposed method over some of the existing methods. |
Author | Gerokostopoulos, A Huairui Guo Haitao Liao Mettas, A |
Author_xml | – sequence: 1 surname: Huairui Guo fullname: Huairui Guo email: Harry.Guo@ReliaSoft.com organization: Theor. Dev., ReliaSoft Corp., Tucson, AZ, USA – sequence: 2 surname: Haitao Liao fullname: Haitao Liao email: hliao4@utk.edu organization: Ind. & Inf. Eng. Dept., Univ. of Tennessee, Knoxville, TN, USA – sequence: 3 givenname: A surname: Gerokostopoulos fullname: Gerokostopoulos, A email: Athanasios.Gerokostopoulos@ReliaSoft.com organization: Theor. Dev., ReliaSoft Corp., Tucson, AZ, USA – sequence: 4 givenname: A surname: Mettas fullname: Mettas, A email: Adamantios.Mettas@ReliaSoft.com organization: Product Dev., ReliaSoft Corp., Tucson, AZ, USA |
BookMark | eNo1j8tKAzEYRiNWsFP7AOImLzBj_kkySZa1XqEieAF3JRP_lMhMpiTZ9O0VrKuPA4cDX0VmcYpIyCWwBoCZ69fV81vTMoBGKimEgBNSgWiF0Fp26pQsjdL_rOSMzBkIU4MQn-ekyvmbMabajs3JzS3msIt08jThEGwfhlAO9AvHKeaSbAlTpAVzCXFH_ZR-rb0NyfYD0nzIBcd8Qc68HTIuj7sgH_d37-vHevPy8LRebeoASpYauANjtTath1ZC56R0qlMolfMKey6NQ9Sea4aCMe40FwY501JoriRoviBXf92AiNt9CqNNh-3xP_8BR-RN7g |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/RAMS.2011.5754441 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Xplore IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) (UW System Shared) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISBN | 1424488567 9781424488551 1424488559 9781424488568 |
EndPage | 6 |
ExternalDocumentID | 5754441 |
Genre | orig-research |
GroupedDBID | -~X 29O 6IE 6IF 6IH 6IK 6IL 6IM 6IN AAJGR AAWTH ABLEC ADZIZ ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IJVOP IPLJI M43 OCL RIE RIL RIO RNS |
ID | FETCH-LOGICAL-i175t-13c19a8892f12516c55c767e57cf7eb359cee8f380e4003c8349e308548375183 |
IEDL.DBID | RIE |
ISBN | 9781424488575 1424488575 |
ISSN | 0149-144X |
IngestDate | Wed Aug 27 02:46:52 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i175t-13c19a8892f12516c55c767e57cf7eb359cee8f380e4003c8349e308548375183 |
PageCount | 6 |
ParticipantIDs | ieee_primary_5754441 |
PublicationCentury | 2000 |
PublicationDate | 2011-Jan. |
PublicationDateYYYYMMDD | 2011-01-01 |
PublicationDate_xml | – month: 01 year: 2011 text: 2011-Jan. |
PublicationDecade | 2010 |
PublicationTitle | 2011 Proceedings - Annual Reliability and Maintainability Symposium |
PublicationTitleAbbrev | RAMS |
PublicationYear | 2011 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0007260 ssj0000669633 |
Score | 1.8048108 |
Snippet | Reliability Demonstration Testing (RDT) for non-repairable systems has been successfully implemented in many industries, such as microelectronics, aerospace... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1 |
SubjectTerms | Design methodology Equations Fisher information matrix Mathematical model Reliability demonstration testing Reliability engineering repairable systems Testing Upper bound |
Title | Design of reliability demonstration testing for repairable systems |
URI | https://ieeexplore.ieee.org/document/5754441 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELZKJ1h4tIi3PDCSkiZ2Yq88KoQEQohK3SrHuaAKSKuSDvDrubOTFhADUgYnihTHcXzfne_7jrFTEwuJdg4CkxsTCAUCW9IGESht0GDpKHPZFvfJzVDcjuSoxc6WXBgAcMln0KOm28vPp3ZBoTJ03qUQxFJfQ8fNc7WW8RQ0nTiXVqtwGjmGMHkAAToNo4bUpagkZaP11JzX2539UJ8_ogPtlT3rp_0ou-KszmCT3TX99ckmL71FlfXs5y8px_--0Bbrrvh9_GFpubZZC8odtvFNmrDDLq5cagefFnwOrxOv5v3Bc3gjQOmnDa9IoqN85gh88a6ZmcyJiMW9OvR7lw0H10-XN0FdbyGYIIigqvS2r41SOioI9iRWSpsmKUiSLkKnW2rslypiFQL--bFVsdAQI2YjVXqJa8Mua5fTEvYoYSox-LEtpGj-wzA3CIvjQmRRVCRJGBX7rEOjMZ55SY1xPRAHf18-ZOs-lEvHEWtX8wUcIxaoshM3Cb4AEvCrdQ |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELaqMgALjxbxJgMjKWliJ_bKoyrQVgi1UrfKcS-oAtKqpAP8eu7ipAXEgJTBiSLFcRzfd-f7vmPsXAdcoJ0DV4-1drkEji1hXB-k0miwlB_n2Ra9sD3g90MxrLCLJRcGAPLkM2hQM9_LH0_NgkJl6LwLzomlvoZ2nyvL1lpGVNB44mxarcORn3OEyQdw0W0YlrQuSUUpS7Wn8rzY8Gx66vIJXWir7Vk870fhldzutLZYt-yxTTd5aSyyuGE-f4k5_veVtll9xfBzHpe2a4dVIN1lm9_ECWvs6iZP7nCmiTOH14nV8_5wxvBGkNJOHCcjkY702UHoi3fN9GROVCzH6kO_19mgddu_brtFxQV3gjCC6tKbptJSKj8h4BMaIUwURiBIvAjdbqGwXzIJpAf47wdGBlxBgKiNdOkFrg57rJpOU9inlKlQ4-c2ECEA8LyxRmAcJDz2_SQMPT85YDUajdHMimqMioE4_PvyGVtv97udUeeu93DENmxgl45jVs3mCzhBZJDFp_mE-AJNe67F |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2011+Proceedings+-+Annual+Reliability+and+Maintainability+Symposium&rft.atitle=Design+of+reliability+demonstration+testing+for+repairable+systems&rft.au=Huairui+Guo&rft.au=Haitao+Liao&rft.au=Gerokostopoulos%2C+A&rft.au=Mettas%2C+A&rft.date=2011-01-01&rft.pub=IEEE&rft.isbn=9781424488575&rft.issn=0149-144X&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FRAMS.2011.5754441&rft.externalDocID=5754441 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0149-144X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0149-144X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0149-144X&client=summon |